2017
DOI: 10.1021/acs.analchem.7b00210
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Fabrication of Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes to Image Surface Topography and Reactivity at the Nanoscale

Abstract: Electrocatalysts, used in energy applications, rely on the solid-liquid interface to carry out productive chemistry. This interface is generally less amenable to standard surface-science characterization methods, making the investigation of the surface activity, catalyst structure and chemical evolution at the nanoscale very challenging. Bulk measurements have been applied, but these lack sufficient resolution to identify conclusively which structures (protrusions, flat film surface, or cracks) are responsible… Show more

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Cited by 23 publications
(20 citation statements)
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“…An EC‐AFM probe can be modified in different ways, for example fabricated to be a SECM probe by using a Pt wire with insulation sheath as the tip . With these modifications, EC‐AFM can carry out the functions of a SECM setup on top of normal EC‐AFM imaging.…”
Section: Electrochemical Scanning Probe Microscopiesmentioning
confidence: 99%
“…An EC‐AFM probe can be modified in different ways, for example fabricated to be a SECM probe by using a Pt wire with insulation sheath as the tip . With these modifications, EC‐AFM can carry out the functions of a SECM setup on top of normal EC‐AFM imaging.…”
Section: Electrochemical Scanning Probe Microscopiesmentioning
confidence: 99%
“…SECM-SICM for example uses the SICM component of the probe as a means of achieving distance control for topography, with simultaneous measurement of an electrochemical signal using the SECM component of the probe, and is discussed in greater detail in Section 3 (vide infra). Although SECM-SICM and SECM-AFM require specialized probes (Figure 1), these are becoming more widely adopted [39]. For example, SECM-AFM probes are now commercially available, and SECM-SICM probes can be fabricated in minutes at low cost (excluding the large initial cost of a laser-based pipette puller).…”
Section: Constant-distance Imaging Modesmentioning
confidence: 99%
“…There are also combined techniques such as SECM-SICM [30][31] and SECM-atomic force microscopy (AFM) [32]. However, ion conductance (vide infra) and AFM, when coupled to SECM, require specialized probes that allow for the deconvolution of topography and electroactivity [33]. SECM-AFM probes are commercially available, although due to the nature of feedback of AFM, imaging soft cellular samples can be problematic [34].…”
Section: Constant-distance Imaging Modesmentioning
confidence: 99%