“…For the kth FAU recognition, the database is clustered into two different classes {V (1) k , V (2) k } each one representing one possible kth FAU state (presence or absence). The grid deformation feature vector g j ∈ R Q is used as an input to 17 two-class SVM systems, each one detecting a specific FAU (the FAU set includes FAUs 1,2,4,5,6,7,9,10,12,15,16,17,20,23,24,25 and 26). Each SVM system, uses the Candide node geometrical displacements to decide whether a specific FAU is activated for the test grid under examination or not.…”