2020
DOI: 10.1002/admi.202000858
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Facile Resist‐Free Nanopatterning of Monolayers of MoS2 by Focused Ion‐Beam Milling

Abstract: Nanopatterning of monolayers of transition metal dichalcogenides offers a new avenue for the creation of nanoscale light sources and their integration into hybrid nanophotonic systems. Here, focused gallium ion‐beam milling is employed as a resist‐free and simple nanofabrication approach to pattern MoS2 monolayers grown by chemical vapor deposition into nanoribbons. Using photoluminescence (PL), Raman, and valley polarization spectroscopy, it is investigated how the optoelectronic properties of the MoS2 monola… Show more

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Cited by 18 publications
(13 citation statements)
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“…Focused ion beam (FIB) seems an especially appealing technique for the generation of optically active defects in vdW materials due to its versatility, high resolution, ease of use, and scalability. Notably, FIB has found widespread use for patterning of 2D materials as a resist-free method, , mitigating omnipresent polymer contamination of the patterned material. And the emergence of commercially available plasma FIB (PFIB) machines, employing ions of inert gases, such as argon and xenon, instead of liquid metals, has solved the long-standing problem of sample contamination by gallium ions in traditional FIB systems. , Nevertheless, while deterministic defect generation in hBN using FIB has been recently demonstrated, , achieving submicron spatial accuracy, a clear understanding of the FIB irradiation effects and the formation of defect sites in hBN is lacking.…”
Section: Introductionmentioning
confidence: 99%
“…Focused ion beam (FIB) seems an especially appealing technique for the generation of optically active defects in vdW materials due to its versatility, high resolution, ease of use, and scalability. Notably, FIB has found widespread use for patterning of 2D materials as a resist-free method, , mitigating omnipresent polymer contamination of the patterned material. And the emergence of commercially available plasma FIB (PFIB) machines, employing ions of inert gases, such as argon and xenon, instead of liquid metals, has solved the long-standing problem of sample contamination by gallium ions in traditional FIB systems. , Nevertheless, while deterministic defect generation in hBN using FIB has been recently demonstrated, , achieving submicron spatial accuracy, a clear understanding of the FIB irradiation effects and the formation of defect sites in hBN is lacking.…”
Section: Introductionmentioning
confidence: 99%
“…For example, the WS 2 @Fe 3 O 4 nanocomposites [ 27 ] can be used for imaging and therapy functionalities. At K and K’ points of hexagonal Brillouin zones, the monolayer WS 2 with direct bandgap can realize the 2PA process [ 28 , 29 ]. The metal substrates could enhance the resonance coupling of the hybrid system [ 30 ].…”
Section: Introductionmentioning
confidence: 99%
“…Van der Waals materials have emerged as a promising building block for next-generation optical and electronic devices [ 1 , 2 , 3 , 4 , 5 , 6 , 7 , 8 ]. Their planar structure [ 9 , 10 ] and the outstanding compatibility with existing manufacturing techniques [ 11 , 12 , 13 , 14 , 15 ] make such materials ideal for integration into modern industrial and scientific devices. Among layered materials, graphene [ 16 ], MoS 2 [ 17 ], and hBN [ 18 ] have received the most attention, as they were the first [ 19 , 20 , 21 ] to catch researchers’ interest during the “two-dimensional” revolution [ 22 ] in material science.…”
Section: Introductionmentioning
confidence: 99%