2004 IEEE International Reliability Physics Symposium. Proceedings
DOI: 10.1109/relphy.2004.1315414
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Failure analysis on resistive opens with Scanning SQUID Microscopy

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Cited by 7 publications
(1 citation statement)
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“…An AC bias is utilized on the sample to enable lock-in amplification for noise reduction [7]. Magnetic field data are transformed into current density images [8] which typically show higher gradients inherent in localized narrow current paths or dissolution of current density where narrower paths dissipate to much broader conductors or power planes at short circuit sites.…”
Section: Magnetic Current Imagingmentioning
confidence: 99%
“…An AC bias is utilized on the sample to enable lock-in amplification for noise reduction [7]. Magnetic field data are transformed into current density images [8] which typically show higher gradients inherent in localized narrow current paths or dissolution of current density where narrower paths dissipate to much broader conductors or power planes at short circuit sites.…”
Section: Magnetic Current Imagingmentioning
confidence: 99%