“…Different statistical features, such as local variance (Won et al, 2002) and forth-order moments (Kim, 2005) in the spatial domain, the variance (Wang et al, 2001) and the multi-scale description (Ye and Lu, 2002) of high-frequency coefficients in the wavelet domain, are exploited to measure the degree of focus for each pixel. The method in (Kim et al, 2007) is further extended to block based processing for speedup. However, the above region based methods usually require a sufficiently blurred background for a reliable segmentation of focused objects.…”