2001
DOI: 10.1109/43.969435
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Fault-diagnosis-based technique for establishing RTL and gate-level correspondences

Abstract: In this paper, we address an important problem associated with hierarchical design flows (termed the mapping problem): identifying correspondences between a signal in a high-level specification and a net in its lower level implementation. Conventional techniques use shared names to associate a signal with a net whenever possible. However, given that a synthesis flow may not preserve names, such a solution is not universally applicable. This work provides a robust framework for establishing register-transfer le… Show more

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Cited by 8 publications
(9 citation statements)
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References 14 publications
(15 reference statements)
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“…The strategy proposed in [10] works in a similar way. The authors introduce a stuck-at fault at the signal of interest in the RTL description.…”
Section: Design Mappingmentioning
confidence: 82%
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“…The strategy proposed in [10] works in a similar way. The authors introduce a stuck-at fault at the signal of interest in the RTL description.…”
Section: Design Mappingmentioning
confidence: 82%
“…Formal equivalence checkers are used to this purpose, however they require a lot of resources in terms of time and memory. In [10] an interesting fault simulation-based approach is proposed. The authors exploit the fact that circuit diagnosis provides an effective method for identifying a fault location in the circuit.…”
Section: Introductionmentioning
confidence: 99%
“…[9] proposed a method of finding candidates for functionally equivalent nets of a given bit-sliced RTL signal line using fault diagnosis techniques. In this paper, their method is utilized to solve the signal line mapping problem.…”
Section: Signal Line Mapping Problemmentioning
confidence: 99%
“…A set of the nets having equivalent faults is referred to as E Gv . Steps 1 to 3 are the same as the procedure for finding a functionally equivalent signal line by using the fault diagnosis technique in [9]. In [9], the complete test set T for the detectable faults in a gate level circuit is used as the input patterns for fault diagnosis.…”
Section: Generate a Complete Test Set T For All The Testable Stuck-mentioning
confidence: 99%
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