2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2020
DOI: 10.1109/dft50435.2020.9250871
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Fault resilience analysis of a RISC-V microprocessor design through a dedicated UVM environment

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Cited by 21 publications
(14 citation statements)
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“…The FI approach adopted to evaluate the proposed microarchitecture scheme is similar to that reported in [50].…”
Section: B Time-frame-span Methodologymentioning
confidence: 99%
See 1 more Smart Citation
“…The FI approach adopted to evaluate the proposed microarchitecture scheme is similar to that reported in [50].…”
Section: B Time-frame-span Methodologymentioning
confidence: 99%
“…On the other hand, the design reported in [40] exhibits the highest overhead in terms of both time and hardware resources. The works in [43], [44], and [36] present the error percentage for each benchmark and use a random FI on the entire architecture, allowing us to perform a comparison, although the confidence level of the results is limited by the differences in the number of randomly injected faults and the statistical error margin [50]. As introduced in [43], to compare two different FT design approaches; it is possible to refer to the normalized failure percentage (NFP), obtained by dividing the failure percentage of the protected microarchitecture by the failure percentage obtained on the unprotected version of the same microarchitecture subjected to the same FI for all the designs to be compared.…”
Section: Comparison With Existing Fault-tolerant Risc-v Design Case S...mentioning
confidence: 99%
“…To validate the resilience of both architectures, we implemented a Time Frame Spanning fault-injection (FI) simulation [24], within a Universal Verification Methodology (UVM) environment able to simulate SEU faults hitting synchronous registers in the design. We, furthermore, implemented a classical random Monte Carlo FI simulation specifically devoted to analyzing the potential improvement given by an ideal memory-scrubbing unit in the SPMs of the VCUs.…”
Section: Validationmentioning
confidence: 99%
“…The Time Frame Spanning methodology [24] divides the whole execution time into M different intervals called time frames. Unlike classical Monte Carlo FI methods, the approach performs the deterministic injection of many faults within the architecture in a specific time frame within the total execution time for each target bit in the hardware architecture.…”
Section: Failure Probability Estimation With Time Frame Spanning Fimentioning
confidence: 99%
“…It explores several fault tolerance techniques such as spatial and temporal redundancy, ECCs, and watchdog monitoring. A detailed fault resilience analysis for a TMR variant of Klessydra is performed in [9]. SHAKTI-F [10] achieves SEE tolerance for a 5-stage inorder microprocessor while keeping area and performance penalties low.…”
Section: Related Workmentioning
confidence: 99%