2023 Silicon Nanoelectronics Workshop (SNW) 2023
DOI: 10.23919/snw57900.2023.10183921
|View full text |Cite
|
Sign up to set email alerts
|

FDSOI-based 1T Pixel Sensor with Long-term Data Retention for in-situ Convolution Computing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…During exposure, the light goes through the thin BOX and is converted to electrons in the depletion region. 33) The collection of photoelectrons under the BOX induces backgate modulation by modifying the potential in the underlying region, which will cause a V TH shift of the nMOSFET, resulting in the I DS change as a readout signal. We fabricate the 1 T pixel structure using 22 nm FDSOI technology 34) as shown in the transmission electron microscopy (TEM) image in Fig.…”
Section: Fdsoi-based 1 T Pixel Architecturementioning
confidence: 99%
“…During exposure, the light goes through the thin BOX and is converted to electrons in the depletion region. 33) The collection of photoelectrons under the BOX induces backgate modulation by modifying the potential in the underlying region, which will cause a V TH shift of the nMOSFET, resulting in the I DS change as a readout signal. We fabricate the 1 T pixel structure using 22 nm FDSOI technology 34) as shown in the transmission electron microscopy (TEM) image in Fig.…”
Section: Fdsoi-based 1 T Pixel Architecturementioning
confidence: 99%