2014
DOI: 10.1016/j.electacta.2014.03.029
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Focused ion beam (FIB)-induced changes in the electrochemical behavior of boron-doped diamond (BDD) electrodes

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Cited by 7 publications
(5 citation statements)
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“…Proposed fabrication processes are non-scalable and show low repeatability of fabricated structures [28]. Moreover, techniques like FIB or RIE defect diamond surface and provide co-doping by other species like gallium or fluorine influencing electrical and electrochemical properties [29].…”
Section: Introductionmentioning
confidence: 99%
“…Proposed fabrication processes are non-scalable and show low repeatability of fabricated structures [28]. Moreover, techniques like FIB or RIE defect diamond surface and provide co-doping by other species like gallium or fluorine influencing electrical and electrochemical properties [29].…”
Section: Introductionmentioning
confidence: 99%
“…The UD film shows a single diamond (sp 3 carbon bond) peak at approximately 1332 cm −1 , indicating a high degree of crystallinity and purity [46][47][48][49]. By contrast, the BDD film shows lower crystal quality and owns additional peaks at around 472 cm −1 and 1220 cm −1 , resulting from boron dopants incorporated into the lattice [50,51]. Additionally, the diamond characteristic peak (related to the sp 3 carbon bond) for BDD is downshifted to ∼1305 cm −1 , and considerably attenuated and broadened due to the boron doping [28,52,53].…”
Section: Experiments and Resultsmentioning
confidence: 99%
“…All solutions were prepared with Elga high purity water (Elga Labwater; VWS Deutschland GmbH, Celle, Germany). Electrochemical experiments were performed using a potentiostat (CHI 660c; CHInstruments, Inc., Austin, TX, USA) in combination with a customized liquid cell . An Ag/AgCl (3 M KCl) electrode was used as reference electrode and a platinum wire (diameter 1 mm) served as auxiliary electrode in the three‐electrode setup.…”
Section: Methodsmentioning
confidence: 99%