Silver chalcogenides have attracted
a great deal of interest due
to their promise for exhibiting novel topological properties. Using
scanning tunneling microscopy/spectroscopy (STM/S), we have characterized
the atomic structure and electronic properties of a monoclinic Ag2Se thin film, similar to β-Ag2Te, grown on
a SrTiO3 (STO)(001) substrate by molecular beam epitaxy
(MBE). Three different types of Ag2Se atomic terminations
are observed on the surface: (i) homogeneous hexagonal-like, (ii)
rough mixed, and (iii) flat zigzag-striped structures. Structural
analysis indicates that the different atomic terminations stem from
different growth directions, which can be attributed to the lattice
mismatch between the substrate and the Ag2Se film. STS
analysis of these atomic terminations uncovers different features
near the Fermi level, indicating constituent- and direction-dependent
electronic properties. This Letter presents a practical method to
grow monoclinic thin film Ag2Se and provides insight into
its physical properties.