Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model From TLP Measurement

Abstract

In order to ensure reliability of systems early in the design phase, it is becoming crucial to have models able to predict the behavior of systems exposed to ElectroStatic Discharge (ESD). This is an increasing necessity since the number of embedded electronic products is growing and since they are employed in applications where people's safety is a requirement, such as automotive and aeronautic applications. Until now, quasi-static models of protection devices have succeeded in providing fairly good results in failure predictions (mainly hard failures). Today, the increased frequency range of such devices requires dynamic models able to reproduce their transient behavior. In this paper, we investigate if conventional methods for modeling linear devices, generally used in the frequency domain, could be used to obtain an equivalent frequency model for ESD protection devices, which exhibit non-linear behavior. A methodology to extract an ESD protection SPICE model from Transmission Line Pulse (TLP) measurements to address transient and frequency simulation is proposed and detailed. We demonstrate that, in well-defined conditions, such frequency models can give accurate results to predict overshoots related to protection device triggering delays. Validation of the models is performed under TLP and Human Metal Model (HMM) conditions on three off-the-shelf devices.

A fast and efficient Model Extraction Method to predict the transient Response of ESD Protection Devices

“…The method is based on the use of TLP generator to reach high power injection combined with Time Domain Reflectometry (TDR) (Fig1), as introduced in [8] In this paper, we propose a different measurement and calibration set-up. The proposed set-up uses only one voltage probe and no current probe, which may have bandwidth limitation, as suggested in [8,9]. From TLP-based TDR measurements TLP an equivalent S parameter model is obtained assuming a Linear Temporal Invariance (LTI).…”

“…From TLP-based TDR measurements TLP an equivalent S parameter model is obtained assuming a Linear Temporal Invariance (LTI). This assumption has been addressed in paper [9] for protection devices.…”

Investigation of Frequency Models to Predict Dynamic Behavior of ESD Protection Networks

“…Here, a different measurement and calibration setup are presented. The proposed setup uses only one voltage probe and no current probe, which may introduce bandwidth limitation as suggested in [22] and [23]. From our proposal measurement system, called TLP-based TDR measurements, an equivalent S parameter model is obtained assuming a linear time-invariance (LTI) condition.…”

“…From our proposal measurement system, called TLP-based TDR measurements, an equivalent S parameter model is obtained assuming a linear time-invariance (LTI) condition. This assumption has been addressed in paper [23] for protection devices. In this previous paper, the obtained model bandwidth was 200 MHz.…”