Full field electron spectromicroscopy applied to ferroelectric materials

Barrett, Nick; Rault, Julien; Wang, J. L.; Mathieu, Claire; Locatelli, Andrea; Menteş, Tevfik Onur; Niño, M. Á.; Fusil, S.; Bibès, Manuel; Barthélémy, A.; Sando, Daniel; Ren, Wei; Prosandeev, S. A.; Bellaïche, L.; Vilquin, Bertrand; Petraru, A.; Krug, I.; Schneider, Claus M.

doi:10.1063/1.4801968

Cited by 49 publications

(48 citation statements)

References 78 publications

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“…The key to discover or design multiferroic materials is a fundamental understanding of the microscopic coupling mechanisms, particularly, the behavior of the underlying domain structures, the role of spinorbit coupling, and the nanoscale confinement. Soft X-ray microscopies are therefore ideally suited to investigate such materials [206], [207].…”

Section: B Magnetic Dwsmentioning

confidence: 99%

X-Ray Imaging of Magnetic Structures

Fischer

2015

IEEE Trans. Magn.

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The characterization of nanoscale magnetic structures, their static properties, and fast spin dynamics with polarized soft X-rays has become an indispensable analytical tool due to the unique features of those probes. The spectroscopic magnetic response serves as a fingerprint of the specimen and can give quantitative information on element-specific spin and orbital magnetic moments. Images of magnetic domain structures at a spatial resolution down to nearly 10 nm, ultimately in all three dimensions, can be obtained with various X-ray microscopy techniques and can further be combined with stroboscopic pump-probe schemes to image the spin dynamics of spin structures, such as the motion of domain walls in nanowires or the vortex core dynamics in micropatterned magnetic elements. Next generation sources of polarized soft X-rays such as X-ray free electron lasers or high-harmonic generation laser sources hold the promise to provide nanometer spatial and femtosecond time resolution, enabling to address thus fundamental magnetic length and time scales in magnetism. This paper reviews the various X-ray imaging techniques using polarized soft X-rays by summarizing their characteristic features, recent achievements, and current limitations as well as future opportunities. A brief overview on other magnetic imaging techniques are given to set magnetic X-ray imaging techniques into context. Index Terms-Magnetic diffractive imaging, photoemission electron microscopy, soft X-ray spectromicroscopy, spin dynamics, X-ray magnetic circular dichroism (XMCD), X-ray optics. 0018-9464

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Section: B Magnetic Dwsmentioning

confidence: 99%

X-Ray Imaging of Magnetic Structures

Fischer

2015

IEEE Trans. Magn.

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“…Micron-scale ferroelectric domain recognition of lightly doped ferroelectric samples can be performed using energy filtered photoelectron emission microscopy (PEEM). [25] PEEM demonstrated the existence of domains in BTO above the Curie temperature due to anionic surface relaxation. [26] In this letter we use synchrotron radiation-induced PEEM with linearly polarized light to study the surface band structure of micron sized ferroelectric domains in doped BTO(001).…”

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confidence: 98%

Polarization Sensitive Surface Band Structure of DopedBaTiO3(001)

et al. 2013

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We present a spatial and wave-vector resolved study of the electronic structure of micron sized ferroelectric domains at the surface of a BaTiO(3)(001) single crystal. The n-type doping of the BaTiO(3) is controlled by in situ vacuum and oxygen annealing, providing experimental evidence of a surface paraelectric-ferroelectric transition below a critical doping level. Real space imaging of photoemission threshold, core level and valence band spectra show contrast due to domain polarization. Reciprocal space imaging of the electronic structure using linearly polarized light provides unambiguous evidence for the presence of both in- and out-of-plane polarization with two- and fourfold symmetry, respectively. The results agree well with first principles calculations.

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“…In this case, the elastically backscattered electrons form low energy diffraction patterns of the sample surface at the backfocal plane of the objective lens. If an illumination aperture is introduced to the objective lens, a selected area-low energy diffraction (micro-LEED) can be performed on the sample [150,151].…”

Section: Low-energy Electron Microscopymentioning

confidence: 99%

Structural and Electronic Properties of Graphene on 4H- and 3C-SiC

Bouhafs¹

2016

Linköping Studies in Science and Technology. Dissertations

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Je dédie cette thèse pour ceux qui sont très loin de moi et très prochesà mon coeur:Pour celle qui vient de l'île des rêves et qui a changè ma vie au plus beau rêve.Pour celle que je dois ma vie. Pour ma famille.Pour ceux qui ne perdent jamais la foi en l'humanité. v ABSTRACTGraphene is a one-atom-tick carbon layer arranged in a honeycomb lattice. Graphene was first experimentally demonstrated by Andre Geim and Konstantin Novoselov in 2004 using mechanical exfoliation of highly oriented pyrolytic graphite (exfoliated graphene flakes), for which they received the Nobel Prize in Physics in 2010. Exfoliated graphene flakes show outstanding electronic properties, e.g., very high free charge carrier mobility parameters and ballistic transport at room temperature. This makes graphene a suitable material for next generation radio-frequency and terahertz electronic devices. Such applications require fabrication methods of large-area graphene compatible with electronic industry. Graphene grown by sublimation on silicon carbide (SiC) offers a viable route towards production of large-area, electronic-grade material on semi-insulating substrate without the need of transfer. Despite the intense investigations in the field, uniform wafer-scale graphene with very high-quality that matches the properties of exfoliated graphene has not been achieved yet. The key point is to identify and control how the substrate affects graphene uniformity, thickness, layer stacking, structural and electronic properties. Of particular interest is to understand the effects of SiC surface polarity and polytype on graphene properties in order to achieve large-area material with tailored properties for electronic applications. The main objectives of this thesis are to address these issues by investigating the structural and electronic properties of epitaxial graphene grown on 4H-SiC and 3C-SiC substrates with different surface polarities.The first part of the thesis includes a general description of the properties of graphene, bilayer graphene and graphite. Then, the properties of epitaxial graphene on SiC by sublimation are detailed. The experimental techniques used to characterize graphene are described. A summary of all papers and contribution to the field is presented at the end of Part I. Part II consists of seven papers.Paper I reports on the structural, vibrational, and dielectric function properties of graphene grown on the C-face of 4H-SiC(000 − 1) with surface defects. We have shown that the average number of graphene layers, the size of the domains with uniform thickness and the crystallite size increase with the increase of temperature. This improved graphene quality is attributed to an enhanced sublimation of Si from the SiC and to the elimination of SiC surface defects by surface restructuring during the sublimation growth. Central result of the paper is the transition from decoupled to Bernal stacked graphene layers with the increase in growth temperature, which is explained by a competition between growth mechanisms. We also determin...

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Full field electron spectromicroscopy applied to ferroelectric materials

Abstract: Articles you may be interested inUltrahigh-spatial-resolution chemical and magnetic imaging by laser-based photoemission electron microscopy Rev. Sci. Instrum. 86, 023701 (2015)

Cited by 49 publications

References 78 publications

X-Ray Imaging of Magnetic Structures

X-Ray Imaging of Magnetic Structures

Polarization Sensitive Surface Band Structure of DopedBaTiO3(001)

Structural and Electronic Properties of Graphene on 4H- and 3C-SiC

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