2014
DOI: 10.1016/j.cplett.2014.10.045
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Ga-vacancy induced room temperature ferromagnetism observed in N-irradiated GaN films

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Cited by 20 publications
(9 citation statements)
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“…Comparing the obtained results with experiments, we note that, according to the results, the observed collective ferromagnetism in GaN systems [7][8][9][10][11] can originate from magnetic interaction between V Ga O N defects. And in Ga-rich InGaN alloys, we predict even stronger FM.…”
Section: Discussionsupporting
confidence: 68%
See 1 more Smart Citation
“…Comparing the obtained results with experiments, we note that, according to the results, the observed collective ferromagnetism in GaN systems [7][8][9][10][11] can originate from magnetic interaction between V Ga O N defects. And in Ga-rich InGaN alloys, we predict even stronger FM.…”
Section: Discussionsupporting
confidence: 68%
“…III-nitride materials such as GaN and InGaN have found their applications in advanced solid-state lighting technologies [1][2][3] and optoelectronic devices including diodes or solar cells [4][5][6]. Moreover, the ferromagnetism (FM) in GaN or InN without doping by transition metal atoms was recently observed [7][8][9][10][11]. This FM was ascribed to the formation of native defects, such as cation vacancies or their complexes.…”
mentioning
confidence: 99%
“…Positron annihilation is a powerful technique for evaluating vacancy‐type defects in semiconductors . Defects introduced by particle irradiation in GaN have been investigated using this method , and the results show that positrons are a powerful probe for studying vacancies and vacancy‐impurity complexes in GaN. In the present study, we used monoenergetic positron beams to study the annealing behaviors and interaction of vacancy‐type defects in Mg‐implanted GaN.…”
Section: Introductionmentioning
confidence: 99%
“…Positron annihilation is a powerful technique to evaluate vacancy-type defects in semiconductors, 16,17 and defects in group-III nitrides have been successfully investigated using this method. [18][19][20][21][22][23][24] In this study, we used a monoenergetic positron beam to probe native vacancies in Al 0.1 Ga 0.9 N layers grown on Si substrates. We showed that the obtained results provided additional insights to explain the change in the leakage blocking capability of these layers.…”
Section: Introductionmentioning
confidence: 99%