2021
DOI: 10.1016/j.nantod.2021.101263
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Gate-controlled MoTe2 homojunction for sub-thermionic subthreshold swing tunnel field-effect transistor

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Cited by 24 publications
(23 citation statements)
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“…The underlying reasons can be ascribed to the difficulty of forming a suitable dielectric on 2D materials and interfacial contamination between layers. [112,117] In a 2D HJ TFET, the low SS can also be ensured by BTBT. Taking 2D HJ TFET with p-type degenerated SnSe 2 as source and WSe 2 as channel for example, thermal emission conduction dominates when negative gate voltage is applied (Figure 6a).…”
Section: D Tunneling Fetmentioning
confidence: 99%
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“…The underlying reasons can be ascribed to the difficulty of forming a suitable dielectric on 2D materials and interfacial contamination between layers. [112,117] In a 2D HJ TFET, the low SS can also be ensured by BTBT. Taking 2D HJ TFET with p-type degenerated SnSe 2 as source and WSe 2 as channel for example, thermal emission conduction dominates when negative gate voltage is applied (Figure 6a).…”
Section: D Tunneling Fetmentioning
confidence: 99%
“…By transferring 2D materials assisted by polycarbonate and polydimethylsiloxane on to a defect-free poly methyl methacrylate substrate, Duong et al achieved an average value of 46 mV dec −1 over 4 decades and a high on/off ratio of ≈10 8 with a graphene-hBN-MoTe 2 vdW heterostructure (Figure 6d-f). [117] To meet the demand of stateof-the-art MOSFETs, 2D TFETs still face the challenge of realizing a stable and steep SS over a sufficient number of decades as well as a large drive current.…”
Section: D Tunneling Fetmentioning
confidence: 99%
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“…The SS parameter of transistors determines the gate voltage ( V G ) necessary to improve drain-source current ( I DS ) by 1 order of magnitude . By this definition, the SS can be calculated as …”
Section: The Critical Factor For Low-voltage Ofetsmentioning
confidence: 99%
“…Typically, the quality of contact formation on any 2D materials determines the potential drop at contact/2D material interface (contact resistance), and carrier injection into or absorbance from the 2D material 129 . The direct metallization of 2D contact can also lead to Fermi-level pinning and thereby compromise the Ohmic-nature of the contact 155 . At the same time, the quality of 2D materials are often susceptible to contamination by metallic atom diffusion from contacts 149 .…”
Section: Tfets Based On Van Der Waals Heterostructurementioning
confidence: 99%