Two-dimensional
(2D) heterostructures show great potential in achieving
negative differential resistance (NDR) effects by Esaki diodes and
or resonant tunneling diodes. However, most of the reported Esaki
diode-based NDR devices realized by bulk 2D films lack sufficient
gate tunability, and the tuning of NDR behavior from appearing to
vanishing remains elusive. Here, a gate-tunable NDR device is reported
based on a vertically stacked black phosphorus (BP) and molybdenum
disulfide (MoS2) thin 2D heterojunction. At room temperature,
a rectifying ratio of ∼6 orders of magnitude from a reverse
rectifying diode to a forward rectifying diode by gate modulation
is obtained. Through analyzing the temperature-dependent electrical
properties, the tunneling mechanism at a certain gate voltage range
is revealed. Moreover, the switchable and continuously gate-tunable
NDR behavior is realized with a maximum peak-to-valley ratio of 1.23
at 77 K, as shown in the I
DS mappings
by sweeping V
DS under different V
GS. In addition, a compact model for gate-tunable
NDR behavior in 2D heterostructures is proposed. To our best knowledge,
this is the first demonstration of NDR behavior in BP-MoS2 heterostructures. Consequently, this work sheds light on the gate-tunable
NDR devices and reconfigurable logic devices for realizing ternary
and reconfigurable logic systems.