2009
DOI: 10.1016/j.cplett.2009.09.104
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Grazing incidence X-ray diffraction study on carbon nanowalls

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Cited by 32 publications
(17 citation statements)
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“…The growth process of carbon nanowalls has been reported by several groups [21][22][23]. We compare those reports with the results of this study.…”
Section: Tem Observationsupporting
confidence: 75%
“…The growth process of carbon nanowalls has been reported by several groups [21][22][23]. We compare those reports with the results of this study.…”
Section: Tem Observationsupporting
confidence: 75%
“…109 Zhang et al, attributed the formation of nucleation sites to the protruding particles formed at the substrate surface which were considered to cause accumulation of hydrocarbon ions. 58 It was accepted by some groups that the graphene growth orientation underwent a change from initially parallel to perpendicular to the substrate, caused by the formation of new crystalline phases 149 or the socalled Volmer-Weber mechanism. 79,96 Yoshimura et al conducted grazing incidence X-ray diffraction study on the asgrown deposits and suggested that it was the formation of a new crystalline phase (possibly a carbon allotrope) at the critical deposition time that changed the orientation of the graphene layers.…”
Section: Challengementioning
confidence: 99%
“…Since then, several groups have explored the growth of VGNs on catalytic as well as non-catalytic metal / dielectric surfaces using various plasma based techniques such as microwave PECVD, dc plasma discharge, ICP-plasma and thermal plasma jet systems. [10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27] In an excellent review, Bo et al 11 summarized the influence of various key process parameters on the synthesis and growth model for NGSs on various types of substrates. In spite of several existing reports, herein we note that, still there is no unique theory that could unveil the atomistic growth mechanism and give a prescription to optimize the process parameters for a given plasma source.…”
Section: Introductionmentioning
confidence: 99%