“…The CE-ZnONPs showed scattering of X-rays in many directions that means the ZnONPs synthesized without UV irradiation were not of defined crystallinity (Figure5A). However, the XRD diffractogram observed at 2θ for the CE-UV-A-ZnONPs showed characteristic peaks at 31.75°, 34.30°, 36.05°, 47.25°, 56.75°, 62.55° and 67.90° (Figure5B), which correspond to the 100, 002, 101, 102, 110, 103 and 200 reflection planes and the hexagonal structure of ZnONPs (JCPDS 36-1451)[55]. Similarly, the XRD diffractogram of CE-UV-C-ZnONPs showed diffraction peaks at 31.65°, 34.55°, 36.10°, 47.70°, 56.45°, 63.00° and 68.1° (Figure5C), which correspond with the 100, 002, 101, 102, 110, 103, and 200 reflection planes and the hexagonal structure of ZnONPs.…”