1998
DOI: 10.1063/1.122824
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Growth and characterization of 10-nm-thick c-axis oriented epitaxial PbZr0.25Ti0.75O3 thin films on (100)Si substrate

Abstract: A 10-nm-thick PbZr0.25Ti0.75O3 thin film is epitaxially grown on a SrRuO3/BaTiO3/ZrO2/Si heterostructure substrate by reactive evaporation. Structural and electrical properties of the film are investigated. It is concluded that the film is ferroelectric and retains a native uniform upward polarization. Artificial downward polarization domains, whose average diameter is 24 nm, can be formed in the film.

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Cited by 67 publications
(32 citation statements)
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“…Artificial linear domains are thus "written" in the sample by a scanning tip held at a voltage beyond the switching threshold, while individual nanodomains are created by the application of voltage pulses to a stationary tip. Such nanodomains, whose size depends on both the duration and magnitude of the voltage pulse, as well as the size of the tip itself [77,78], can be as small as a few nm in radius [79], in particular when ultrasharp tips based on carbon nanotubes are used [80,81,82], and remain fully stable in measurements extending over a year [83,84]. While PFM imaging is clearly neither real-time, nor full-field-of-view, information on the switching dynamics and domain growth rates in the sample can nonetheless be obtained from averaging the size of sufficient numbers of these nanodomains written with a particular voltage pulse duration and magnitude.…”
Section: Using Pfm To Study Individual Ferroelectric Domain Wallsmentioning
confidence: 99%
“…Artificial linear domains are thus "written" in the sample by a scanning tip held at a voltage beyond the switching threshold, while individual nanodomains are created by the application of voltage pulses to a stationary tip. Such nanodomains, whose size depends on both the duration and magnitude of the voltage pulse, as well as the size of the tip itself [77,78], can be as small as a few nm in radius [79], in particular when ultrasharp tips based on carbon nanotubes are used [80,81,82], and remain fully stable in measurements extending over a year [83,84]. While PFM imaging is clearly neither real-time, nor full-field-of-view, information on the switching dynamics and domain growth rates in the sample can nonetheless be obtained from averaging the size of sufficient numbers of these nanodomains written with a particular voltage pulse duration and magnitude.…”
Section: Using Pfm To Study Individual Ferroelectric Domain Wallsmentioning
confidence: 99%
“…There may soon be results bearing on this question as several groups have reported good films with thicknesses less than 10 nm made from several known bulk ferroelectric materials [21,[32][33][34]. Recent improvements in the quality of solvent-crystallized vinylidene fluoride copolymers should help elucidate the effects of nucleation and domain-wall motion in bulk crystals [35][36][37] Fig.…”
mentioning
confidence: 99%
“…1,2 From initial demonstrations of small domain size and high stability, 3,4 through continued enhancement of domain density, 5,6 the local, high-intensity fields generated by metallic atomic force microscopy (AFM) tips were a key element. An important advance has been the functionalization of such tips with carbon nanotubes (CNTs), whose excellent metallic-state electrical conductivity, high strength, and small size have made them particularly interesting for polarization control.…”
mentioning
confidence: 99%