2011
DOI: 10.1016/j.jcrysgro.2010.08.006
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Growth of high-quality InGaN/GaN LED structures on (111) Si substrates with internal quantum efficiency exceeding 50%

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Cited by 23 publications
(15 citation statements)
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“…The work focuses on model multilayer InGaN epitaxial stacks grown on Si wafers with (111) orientation (13), due to the cost and throughput advantages that are expected to result from this materials technology when optimized to offer levels of quality (e.g., threading dislocation densities <10 9 cm −2 ) (13) currently available from material grown on conventional substrates such as sapphire or SiC. The layer configurations appear in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The work focuses on model multilayer InGaN epitaxial stacks grown on Si wafers with (111) orientation (13), due to the cost and throughput advantages that are expected to result from this materials technology when optimized to offer levels of quality (e.g., threading dislocation densities <10 9 cm −2 ) (13) currently available from material grown on conventional substrates such as sapphire or SiC. The layer configurations appear in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, the increase in Al composition into the EBL will degrade the layer's crystalline quality with the generation of strain-induced defects and lead to an even stronger piezoelectric polarization field Therefore, the pulling down of the energy band will become worse, which may lead to an even lower hole-injection efficiency. [3][4][5][6][7][8] Some scientists have tried to use an InAlN EBL to suppress the electron leakage. However, the difficulty of high-quality InAlN material growth is a big challenge.…”
Section: Introductionmentioning
confidence: 99%
“…The miscibility problem of indium and gallium leads to phase separation in highcomposition InGaN, and the large lattice mismatch with the underlying GaN substrate induces more defects and dislocations compared to moderate indium 12.18 EQE variation with peak emission wavelength. A change in indium fraction in InGaN results in variation of IQE (Akita et al , 2007;Chang et al , 2003Chang et al , , 2010Chen et al , 2002;Guo et al , 2010;Kim et al , 2001;Leea et al , 2011;Liu et al , 2011;Lundin et al , 2010;Nakamura and Chichibu, 2000;Nguyen et al ., 2011;Pan et al , 2004;Sato et al , 2008;Sheu et al , 2001;Tadatomo et al , 2001;Wuu et al , 2005aWuu et al , , 2005bYamada et al , 2002;Yamamoto et al , 2010;Zhang et al , 2010Zhang et al , , 2012Zhao et al , 2011). composition (Ho and Stringfellow, 1996;Teles et al , 2000). Insertion of a low indium content InGaN layer prior to the QWs can also boost the performance of green LEDs, but the physics behind the increase in effi ciency is different from that for blue InGaN LEDs.…”
Section: Iii-nitride Visible Ledsmentioning
confidence: 99%