“…Hence, the measured band gap and permittivity can vary even for similarly prepared oxide films. Table 4 depicts measured values of static and dynamic permittivity for most commonly used oxides in MIM diodes for rectenna, such as NiO [105][106][107][108][109], Al 2 O 3 [110][111][112][113][114][115][116][117][118][119], ZnO [108,[120][121][122], TiO 2 [114,119,[123][124][125][126][127][128], CuO [8,129,130], Ta 2 O 5 [91,108,113,126,131], Nb 2 O 5 [17,51,91,108], Cr 2 O 3 [132,133], SiO 2 [114,119], HfO 2 [114,134,135], V 2 O 5…”