Articles you may be interested inA field-programmable-gate-array based time digitizer for the time-of-flight mass spectrometry Rev. Sci. Instrum. 85, 045115 (2014); 10.1063/1.4870922 Time-of-flight mass spectrometry for time-resolved measurements Rev. Sci. Instrum. 78, 034103 (2007); 10.1063/1.2712797 Correction of dead time effects in timeofflight mass spectrometry J. Vac. Sci. Technol. A 12, 405 (1994); 10.1116/1.579255 MASTIF: Mass analysis of secondaries by timeofflight technique. A new approach to secondary ion mass spectrometry Rev. Sci. Instrum. 60, 3188 (1989); 10.1063/1.1140550Timeofflight secondary ion mass spectrometry of polymer materials Modulation of an ion beam is crucial to several applications in time-of-flight ͑TOF͒ mass spectrometry, especially for tandem TOF instruments which require selection of a particular precursor m/z ͑mass to charge͒ value prior to fragmentation. Here we present a detailed description of an ''interleaved comb'' ion deflection gate device with suitable electronics which offers a performance advantage over the more commonly used deflection plate devices. We demonstrate unit mass resolution for selection to m/z 167 in the tandem TOF instrument constructed in our laboratory. Calculations suggest that the real time of unit resolution for our experimental arrangement is greater than 300.