Ge1‑x
Sn
x
alloys
form a heterogeneous material system with high potential
for applications in both optoelectronic and high-speed electronics
devices. The attractiveness of Ge1‑x
Sn
x
lies in the ability to tune the semiconductor
band gap and electronic properties as a function of Sn concentration.
Advances in Ge1‑x
Sn
x
material synthesis have raised expectations recently,
but there are considerable problems in terms of device demonstration.
Although Ge1‑x
Sn
x
thin films have been previously explored experimentally,
in-depth studies of the electrical properties of Ge1‑x
Sn
x
nanostructures are
very limited, specifically those on nanowires grown via a bottom-up
vapor–liquid–solid (VLS) process using metal catalysts.
In this study, a detailed electrical investigation is presented of
nominally undoped Ge1‑x
Sn
x
bottom-up-grown nanowire devices with different
Sn percentages (3–9 at. %). The entire device fabrication process
is performed at relatively low temperatures, the maximum temperature
being 440 °C. Device current modulation is performed through
backgating from a substrate electrode, achieving impressive on–off
current (I
ON/I
OFF) ratios of up to 104, showing their potential for electronic
and sensor-based applications. Contact resistance (R
C) extraction is essential for proper VLS-grown nanowire
device electrical evaluation. Once the R
C contribution is extracted and removed, parameter values such as
mobility can change significantly, by up to 70% in this work. When
benchmarked against other Ge1‑x
Sn
x
electronic devices, the VLS-grown
nanowire devices have potential in applications where a high I
ON/I
OFF ratio is
important and where thermal budget and processing temperatures are
required to be kept to minimum.