2008
DOI: 10.1063/1.3020757
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High precision differential measurement of surface photovoltage transients on ultrathin CdS layers

Abstract: Time-resolved surface photovoltage (SPV) is an important method for studying charge separation, for example, in nanostructured semiconductors. High precision differential measurement of SPV transients was realized with two identical measurement capacitors and high-impedance buffers. In addition, logarithmic readout and averaging procedures were implemented for single transients over eight magnitudes in time. As a model system ultrathin CdS layers were investigated. The thickness dependencies of the SPV amplitu… Show more

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Cited by 36 publications
(23 citation statements)
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“…To investigate photochemical charge transfer in CuBi 2 O 4 nanoparticles, Surface Voltage Spectroscopy (SPS) was employed. 29,30 In this technique, a light-induced change of the contact potential difference (CPD, versus gold Kelvin probe) of a sample film is recorded as a function of the irradiation wavelength/energy ( Figure S1). 31 Depending on the direction of charge transport, this produces either positive or negative photovoltage.…”
Section: Resultsmentioning
confidence: 99%
“…To investigate photochemical charge transfer in CuBi 2 O 4 nanoparticles, Surface Voltage Spectroscopy (SPS) was employed. 29,30 In this technique, a light-induced change of the contact potential difference (CPD, versus gold Kelvin probe) of a sample film is recorded as a function of the irradiation wavelength/energy ( Figure S1). 31 Depending on the direction of charge transport, this produces either positive or negative photovoltage.…”
Section: Resultsmentioning
confidence: 99%
“…The x - and y -signals begin at photon energies between 0.9 and 1.0 eV and reach maxima of −0.65 and 0.24 mV at 1.32 and 1.20 eV, respectively. The present case of a negative sign of the x -signal together with a positive sign of the y -signal can be interpreted as photogenerated electrons being preferentially separated towards the internal interface [19]. …”
Section: Resultsmentioning
confidence: 99%
“…[14][15][16] In this case, undesirable noise often appeared within the first few microseconds, 19 as shown in Figure 3 (red circles). The origin of this system noise should be analyzed first.…”
Section: A Origin Of the System Noise In One-probe Configurationmentioning
confidence: 91%
“…Hereafter, this coherent noise is referred to as system noise, and its origin is the focus of the present work. In this work, the traditional one-probe configuration for TPV measurement [14][15][16] (only one electrode was monitored by an oscilloscope, and the other was grounded) was promoted to the novel two-probe configuration, which allows for TPV measurements at up to 1.5 GHz (bandwidth) and 50 GS/s (sampling rate) without any degradation in the noise level. This two-probe measuring system is able to measure the TPV of either electrode of a typical sandwich-structured photoelectronic device (a thin photosensitive semiconductor layer sandwiched between two electrodes) independently, where one electrode is transparent to allow ambient illumination into the active layer independently.…”
Section: Introductionmentioning
confidence: 99%