2014
DOI: 10.1007/s00339-013-8214-1
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High-rate reactive magnetron sputtering of zirconia films for laser optics applications

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Cited by 18 publications
(6 citation statements)
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“…Figure 3a shows the wavelength dependence of the refractive index values of the fabricated CZ sample at different temperatures of 25 • C, 50 • C, 75 • C and 100 • C. The measured refractive indices at the wavelengths of 447.0 nm, 532.0 nm, 632.8 nm and 785.0 nm are 2.214, 2.1876, 2.1686 and 2.1484 on average at room temperature, respectively, which shows the same trend in dispersion as that in the literature [50,51]. It was also observed that the refractive index of the CZ sample gradually increased as the temperature increases (positive dn/dT), which is attributed to the shift in the absorption edge (bandgap) of the material with increasing temperature [50].…”
Section: Dispersion and Temperture Coefficient Of The Refractive Inde...supporting
confidence: 79%
“…Figure 3a shows the wavelength dependence of the refractive index values of the fabricated CZ sample at different temperatures of 25 • C, 50 • C, 75 • C and 100 • C. The measured refractive indices at the wavelengths of 447.0 nm, 532.0 nm, 632.8 nm and 785.0 nm are 2.214, 2.1876, 2.1686 and 2.1484 on average at room temperature, respectively, which shows the same trend in dispersion as that in the literature [50,51]. It was also observed that the refractive index of the CZ sample gradually increased as the temperature increases (positive dn/dT), which is attributed to the shift in the absorption edge (bandgap) of the material with increasing temperature [50].…”
Section: Dispersion and Temperture Coefficient Of The Refractive Inde...supporting
confidence: 79%
“…The ambient pressure phases of zirconia are monoclinic baddeleyite (M; P2 1 /c), which is stable up to 1205 °C for unstabilized zirconia, three tetragonal (T/T’/T”) phases (P4 2 /nmc) of which the tetragonal phase t is stable from 1205 °C to 2377 °C, and the cubic (C) fluorite structure (Fm m) which is stable from 2377 °C to the melting point [ 13 , 14 , 15 ]. In addition, there are also two orthorhombic (O/O’; Pbca & Pnam) high-pressure phases [ 14 , 16 ] and a rhombohedral/trigonal (R) phase (R ), which may occur under mechanical stress and may be induced by hipping regimes [ 12 , 17 , 18 , 19 ].…”
Section: Introductionmentioning
confidence: 99%
“…Thin films of metal oxide doped zirconia have been prepared by laser ablation [21], RF sputtering [22,23] and sol-gel [24] etc.…”
Section: Introductionmentioning
confidence: 99%