High‐resolution AES study of Ar⁺‐irradiated graphite

Abstract

High-resolution AES (HR-AES) has been used to study the electronic state of Ar + -irradiated graphite in which the increase in the partial charge density caused by the lattice damage has been indicated. At doses of <5 × 10 11 Ar + cm −2 , which was reported as a maximum value to avoid the overlapping cascades, neither plasmon energies nor the work function in highly oriented pyrolytic graphite (

Exciton Autoionization in Ion-Induced Electron Emission

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Ionization Energy and Energy Gap Structure of MoSI Molecular Wires: Kelvin Probe, Ultraviolet Photoelectron Spectroscopy, and Cyclic Voltammetry Measurements

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Determination of absolute number of graphene layers on nickel substrate with scanning Auger microprobe

“…3(a) are almost same as those reported in previous REELS studies. [31][32][33][34] The slight difference between TEM-EELS and SEM-REELS result is thought to result from the effect of the substrate under the graphene layers.…”