High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method

Kozaki, Shigeru; Hashizume, H.; Köhra, Kazutake

doi:10.1143/jjap.11.1514

Cited by 17 publications

(4 citation statements)

References 14 publications

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“…Many authors have reported systems based on X-ray sensitive vidicons (Chikawa & Fujimoto, 1968), conventional television with phosphor screens, sometimes with image intensifiers interposed (Meieran, Landre & O'Hara, 1969;Lang & Reifsnider, 1909;Kozaki, Hashizume & Kohra, 1972) and charge sensitive diode arrays (Rozgonyi, Haszko & Statile, 1970). With conventional sources these authors reported exposure times between 0.5 s and one minute with resolutions in the range from 10/~m to 30/zm over areas of a few mm square.…”

Section: Introductionmentioning

confidence: 99%

Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography

Hart¹

1975

J Appl Cryst

112

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With almost perfect silicon crystals and cleaved lithium fluoride crystals as extreme examples, the feasibility of using synchrotron radiation for X-ray diffraction topography has been investigated. In both spatial resolution and strain resolution the synchrotron source diffraction topographs are competitive with topographs obtained using conventional X-ray sources but exposure times are reduced from several hours per cm 2 to one second per cm 2 using standard recording techniques with llford nuclear emulsions. Contrary to (the author's) expectations, the instrumentation required is far simpler for synchrotron radiation than for conventional sources.

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Section: Introductionmentioning

confidence: 99%

Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography

Hart¹

1975

J Appl Cryst

112

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“…Recent developments may be found in papers dealing with solid-state image intensifiers (60,263) and a new and potentially important device which incorporates an X-ray sensitive fiber optic faceplate (299). Several reports have appeared on instruments utilizing video display units (58,193,363). Development of phospors of improved brightness for use in image intensifier screens (218,260), as well as the development of improved intensifying screens for X-ray film, has continued (8,162,338).…”

Section: Instrumentationmentioning

confidence: 99%

X-ray diffraction

Pfluger¹

1974

Anal. Chem.

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This review presents a general overview of the field of X-ray diffraction with emphasis being on the directions in which applications and research in the areas of instrumentation, analysis, powder methods, topographic methods, determination of molecular structure, etc., have been going rather than presenting a comprehensive listing of all references in which X-ray diffraction was utilized. To do so would have been a formidable task as the use of X-ray diffraction methods in solving problems in chemistry, material sciences, geology, industry, etc., is extremely widespread, as becomes evident after even a rather superficial scan of the literature. This review covers the period of January 1972 through December 1973, mainly by the appearance of an abstract during this time, although several

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“…In order to take X-ray topographs so rapidly that imperfections in crystals may be observed almost in real time, two kinds of techniques have been developed so far: one is to use the intense X-ray source and a vidicon tube with good resolution (Chikawa & Fujimoto, 1968;Chester & Koch, 1969;Rozgonyi, Haszko & Statile, 1970;Chikawa, Fujimoto & Abe, 1972;Chikawa, 1974), and the other is to use a usual source but make the detecting system sensitive with various kinds of image intensifying tubes, where electron scanning is used (Reifsnider & Green, 1968;Lang & Reifsnider, 1969;Meieran, Landre & O'Hara, 1969;Meieran, 1971;Hashizume, Kohra, Yamaguchi & Kinoshita, 1971 ;Kozaki, Hashizume & Kohra, 1972).…”

Section: Introductionmentioning

confidence: 99%

Characteristics of a channel plate as an image intensifier for X-ray topography

Ando¹,

Namikawa²

1976

J Appl Cryst

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A channel plate has been used for taking X-ray diffraction topographs. A topograph of a Si crystal on a fluorescent screen has been recorded by an optical camera. The spatial resolution of the plate has been found to be at least better than 37/~m. The time for the optical recording ofa topograph on this plate proved to be about 102 times shorter than that required by standard topography. The sensitivity of the plate has also been measured for Cr K~ radiation.

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High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method

Cited by 17 publications

References 14 publications

Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography

Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography

X-ray diffraction

Characteristics of a channel plate as an image intensifier for X-ray topography

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