“…Note that these relatively thick films were analyzed instead of the more standard a-Si:H layer thicknesses of ~70-350 nm that are typically used in state-of-the-art TF Si single-junction [32,36,37], tandem [33,37,58], triple-junction [31,38], and quadruple-junction [35,39,59] solar cells. In this way, a clear plateau appears on the positron depth profile in the DB-PAS measurements which enables a more accurate determination of the Doppler S-W values of the film.…”