2014
DOI: 10.1109/jphotov.2014.2357495
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High-Stable-Efficiency Tandem Thin-Film Silicon Solar Cell With Low-Refractive-Index Silicon-Oxide Interlayer

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Cited by 57 publications
(36 citation statements)
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“…In the in-house measurement, an initial efficiency of 13.1% (J sc = 13.1 mA=cm 2 , V oc = 1.302 V, FF = 0.766) and a stabilized efficiency of 12.7% (J sc = 12.9 mA=cm 2 , V oc = 1.330 V, FF = 0.744) after light soaking The relatively large difference found in J sc and FF between two measurements is probably caused by the spectral mismatch of the in-house solar simulator. This confirmed efficiency is slightly higher than the record efficiency of an a-Si:H=µc-Si:H tandem solar cell (stabilized efficiency of 12.63% measured by Newport Corporation) reported recently by Boccard et al 35) It is worth pointing out that our solar cell exhibits only 3% degradation in spite of the thick top-cell design. We attribute this to the improved a-Si:H absorber layer as well as the current-mismatch cell design.…”
Section: Double-junction Solar Cellssupporting
confidence: 66%
“…In the in-house measurement, an initial efficiency of 13.1% (J sc = 13.1 mA=cm 2 , V oc = 1.302 V, FF = 0.766) and a stabilized efficiency of 12.7% (J sc = 12.9 mA=cm 2 , V oc = 1.330 V, FF = 0.744) after light soaking The relatively large difference found in J sc and FF between two measurements is probably caused by the spectral mismatch of the in-house solar simulator. This confirmed efficiency is slightly higher than the record efficiency of an a-Si:H=µc-Si:H tandem solar cell (stabilized efficiency of 12.63% measured by Newport Corporation) reported recently by Boccard et al 35) It is worth pointing out that our solar cell exhibits only 3% degradation in spite of the thick top-cell design. We attribute this to the improved a-Si:H absorber layer as well as the current-mismatch cell design.…”
Section: Double-junction Solar Cellssupporting
confidence: 66%
“…Note that these relatively thick films were analyzed instead of the more standard a-Si:H layer thicknesses of ~70-350 nm that are typically used in state-of-the-art TF Si single-junction [32,36,37], tandem [33,37,58], triple-junction [31,38], and quadruple-junction [35,39,59] solar cells. In this way, a clear plateau appears on the positron depth profile in the DB-PAS measurements which enables a more accurate determination of the Doppler S-W values of the film.…”
Section: A Sample Definitionsmentioning
confidence: 99%
“…Green et al [1]. Noteworthy benchmarks for the PCE for TF-Si technology for small area devices (aperture area approximately 1 cm 2 ) include a MICROMORPH ™ cell at 11.5% developed by TEL Solar-Lab SA [2], and tandem cells (a-Si:H/μc-Si:H) at 12.63% and 12.69% developed, respectively, by EPFL, Neuchâtel [3] and AIST, Tsukuba [4]. For large area modules (aperture area approximately 1.4 m 2 ), results include a 10.9% device developed by LG Electronics [5] based on a triple junction a-Si/a-SiGe/μc-Si device and recently a large area module (1.43 m 2 ) published by LG Electronics [6] at 11.2% (measured at LG) based on the same triple junction a-Si/a-SiGe/μc-Si device.…”
Section: Introductionmentioning
confidence: 99%