“…While complex group III-nitride (III-N) structures and devices, such as lasers [10], light emitting diodes [2,11], Bragg mirrors [12], acousto-optical waveguides [13] and field effect transistors [1][2][3][4][5][6][7]9,[14][15][16][17][18][19][20] have been demonstrated on silicon, high-volume demand is felt for GaN power rectifiers [21,22]. If a Schottky barrier is used for current rectification, the two major requirements for device epitaxy are: (i) the growth of a low n-type doped GaN layer of 3-6 mm (depending on its free carrier concentration) thickness, and (ii) the growth of an n + -type doped GaN contact layer [22][23][24][25][26]. However, taken alone the different thermal expansion coefficients of GaN (5.59 Â 10 À 6 K À 1 ) and of silicon (2.59 Â 10 À 6 K À 1 ), the cool down from epitaxy to room temperature (RT) causes an in-plane dilatation (e 1 ) of the GaN lattice constant a, which according to the following equation…”