1997
DOI: 10.1016/s0925-9635(96)00739-x
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High-voltage Schottky diode on epitaxial diamond layer

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Cited by 46 publications
(19 citation statements)
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“…Very high reverse blocking-voltage of diamond Schottky barrier diodes (SBDs) [2,3] have been reported, however, the breakdown field is typically smaller than 2 MV/cm, this value is significantly low compared with the universally accepted limit of breakdown fields in a diamond [6][7][8]. Recently, higher breakdown field of 3.1 MV/cm has been confirmed [9], and further improvement is expected.…”
Section: Introductionmentioning
confidence: 99%
“…Very high reverse blocking-voltage of diamond Schottky barrier diodes (SBDs) [2,3] have been reported, however, the breakdown field is typically smaller than 2 MV/cm, this value is significantly low compared with the universally accepted limit of breakdown fields in a diamond [6][7][8]. Recently, higher breakdown field of 3.1 MV/cm has been confirmed [9], and further improvement is expected.…”
Section: Introductionmentioning
confidence: 99%
“…For this type of applications, in order to suppress an energy‐loss for the high‐power switching devices, “low on‐resistance ( R on S ),” “fast switching property,” and “high blocking voltage ( V block )” are required simultaneously. Thus, when we apply the excellent properties of diamond to the low‐loss high‐power switching devices, fabrication of a diode structure which meets the aforementioned conditions can be a key‐technology 1–12.…”
Section: Introductionmentioning
confidence: 99%
“…Diamond pn junctions 9 were fabricated for the first time in 2001 after achieving n‐type diamond by phosphorus (P) doping in 1997 for (111) surfaces 13. In 2005, the n‐type diamond was also achieved for (001) surfaces 14, and subsequent research of pn junctions 10–12 has been performed in addition to that of Schottky‐junctions 1–8. However, the resistivity of n‐type layer is still high (10 5 –10 6 Ωcm at phosphorus concentration of ∼10 18 cm −3 8, 15) owing to the deep phosphorus donor level.…”
Section: Introductionmentioning
confidence: 99%
“…The high doping concentration in the δ-pulse is associated with a strong reduction of the boron activation energy so that a highly conductive p-channel below the film surface is created. Pulse-doped diamond layers with very low surface charge concentrations have recently made possible fabrication of diodes with low reverse current densities and a break-through characteristic at U = -150 V. Similarly, a high temperature Schottky-diode has been fabricated operating up to 1000 °C with a forward-toreverse current ratio of >10 at |U| < 10 V using boron pulse-doped diamond as the semiconductor and degenerate doped Si as the metal [EBERT (1997); VESCAN ( , 1998a] (Fig. 10).…”
mentioning
confidence: 99%
“…Right: Force/pressure sensors designed as an array of HOD-diamond cantilever beams[GLUCHE (1997); FLÖTER (1998);].…”
mentioning
confidence: 99%