Higher-harmonic AFM imaging with a high-bandwidth multifrequency Lyapunov filter

Harcombe, David M.; Ruppert, Michael G.; Ragazzon, Michael R. P.; Fleming, Andrew J.

doi:10.1109/aim.2017.8014103

Cited by 10 publications

(12 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In the multifrequency force microscopy (MFFM), multiple cantilever frequencies (higher harmonics and/or higher flexural eigenmodes) are excited to provide information about the tip-sample nonlinearities are recorded [ 113 , 114 ]. With MFFM, there is a potential of overcoming many hurdles including high throughput, material properties, and spatial resolution.…”

Section: Modes Of Operations Of Cantilever-based Afmmentioning

confidence: 99%

Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

Alunda¹,

Lee

2020

Sensors

View full text Add to dashboard Cite

This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.

show abstract

Section: Modes Of Operations Of Cantilever-based Afmmentioning

confidence: 99%

Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

Alunda¹,

Lee

2020

Sensors

View full text Add to dashboard Cite

show abstract

“…The Lyapunov filter [33,35,36] also uses a model-based feedback approach to obtain amplitude and phase of signals at desired frequencies. Under certain conditions, the Lyapunov filter has been shown to be equivalent to the Kalman filter [33].…”

Section: Lyapunov Filtermentioning

confidence: 99%

“…This system representation has been shown to perform similarly to the Kalman filter [28], which is advantageous given its imple- mentation simplicity. Recently, it has been used for higherharmonic AFM for both amplitude and phase-contrast imaging [35,36].…”

Section: Lyapunov Filtermentioning

confidence: 99%

“…To alleviate this issue, the Lyapunov filter [33] was established, which is computationally more efficient than the Kalman filter while achieving similar performance [34]. This was extended to a multifrequency Lyapunov filter, which has seen success in higher-harmonic AFM for both amplitude and phase-contrast imaging [35,36]. A limitation, common to both the Kalman and the Lyapunov filter, is a fixed 1st-order response, which has motivated the development of techniques for the direct design of the demodulator frequency response [37,38].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

A review of demodulation techniques for multifrequency atomic force microscopy

Harcombe¹,

Ruppert²,

Fleming³

2020

Beilstein J. Nanotechnol.

View full text Add to dashboard Cite

This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging.

show abstract

“…The demand for a high tracking bandwidth while maintaining insensitivity to additional frequencies in the signal has motivated the development of filters such as the time-varying Kalman filter [ 44 ] and Lyapunov filter [ 45 – 46 ]. These methods are based on a linear parametric model of the cantilever deflection signal and were shown to be extendable for the estimation of multiple frequencies for multifrequency AFM [ 47 – 49 ].…”

Section: Introductionmentioning

confidence: 99%

A review of demodulation techniques for amplitude-modulation atomic force microscopy

Ruppert¹,

Harcombe²,

Ragazzon³

et al. 2017

Beilstein J. Nanotechnol.

View full text Add to dashboard Cite

In this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode atomic force microscopy experiments in constant-height mode.

show abstract

Higher-harmonic AFM imaging with a high-bandwidth multifrequency Lyapunov filter

Cited by 10 publications

References 19 publications

Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

A review of demodulation techniques for multifrequency atomic force microscopy

A review of demodulation techniques for amplitude-modulation atomic force microscopy

Contact Info

Product

Resources

About