Hydrogen-induced changes of mechanical stress and optical transmission in thin Pd films

Pedersen, T. P. Leervad; Liesch, Ch.; Salinga, C.; Eleftheriadis, T.; Weis, Hansjörg; Wuttig, Matthias

doi:10.1016/j.tsf.2003.12.040

Cited by 38 publications

(4 citation statements)

References 7 publications

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“…The relation includes Young's modulus which could alter upon hydrogen interaction. Conduction of the investigation in concentrations of hydrogen in the range of α-phase permitted for neglecting the E changes [13,14] although one have to be aware that the Young's modulus of the polycrystalline material depends on the lattice constant as follows (3) [15]:…”

Section: Resultsmentioning

confidence: 99%

Influence of hydrogen absorption on stress changes in thin catalytic metal films dedicated for sensors application

et al. 2011

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Abstract:In the paper results of investigation of the influence of low concentration hydrogen on stress changes in thin catalytic metal films were discussed. The concentration of H 2 was altered from 6 ppm to 1% of hydrogen (6N) in nitrogen (6N). Silicon beams covered with palladium or platinum films of various thicknesses were anchored at one end and their deflection at the other end was measured by atomic force microscope. Stress changes were determined by application of modified Stoney formula and compared with results of computer modelling. The influence of stress caused by hydrogen absorption on the alteration of output characteristics of AIII-N based hydrogen sensors was excluded. The time dependence of stress in metallic films for various hydrogen concentrations indicated dissociation limited mechanism of hydrogen absorption.

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Section: Resultsmentioning

confidence: 99%

Influence of hydrogen absorption on stress changes in thin catalytic metal films dedicated for sensors application

et al. 2011

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“…13) The response time significantly decreases after the first cycle and keeps stable at $0:7 s. This kind of cycling effect is probably caused by the removal oxide layer on top of Pd particles surface by the hydrogen cycling. 14)…”

Section: Methodsmentioning

confidence: 99%

Surface Electronic Properties of Discontinuous Pd Films during Hydrogen Exposure

Zhao¹,

Nagata²,

Shikama³

et al. 2011

Jpn. J. Appl. Phys.

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This paper explored the change in the surface resistance of the discontinuous palladium (Pd) films during hydrogen exposure. In our experiments, we observed a remarkable rise in the electrical resistance of the discontinuous film which consists of nano-sized particles, when it was exposed to thin hydrogen. By studying the resistance change ratio before and after hydrogen exposure, we have found that it demonstrates an inverse exponential relationship with the ratio of on-film particle radius to the inter island separation. This suggests that the change in the film resistance under hydrogen exposure is primarily associated with the variation of surface work function which is caused by the hydrogen absorption on the Pd surface. #

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“…For example, a combined stress and optical transmittance study on the hydrogenation of 10 nm palladium films on glass slide substrates revealed a gradual removal of a surface oxide layer that is often not evident in studies of hydrogen content in palladium. 17 A curvature measurement of electrochemical lithiation of silicon has shown that the chemical potential of lithium in silicon is heavily governed by the stress present in the material; 18 the joint measurement scheme also clearly delineates the extent to which the reaction can proceed before the film undergoes plastic deformation, which can inform further engineering of the Li/Si system.…”

Section: Stress Measurementmentioning

confidence: 99%

Apparatus for combined nanoscale gravimetric, stress, and thermal measurements

Murray

Palm

Narayan

et al. 2018

Review of Scientific Instruments

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We present an apparatus that allows for the simultaneous measurement of mass change, heat evolution, and stress of thin film samples deposited on quartz crystal microbalances (QCMs). We show device operation at 24.85 ± 0.05 °C under 9.31 ± 0.02 bars of H as a reactive gas. Using a 335 nm palladium film, we demonstrate that our apparatus quantifies curvature changes of 0.001 m. Using the QCM curvature to account for stress induced frequency changes, we demonstrate the measurement of mass changes of 13 ng/cm in material systems exhibiting large stress fluctuations. We use a one-state nonlinear lumped element model to describe our system with thermal potentials measured at discrete positions by three resistance temperature devices lithographically printed on the QCM. By inputting known heat amounts through lithographically defined Cr/Al wires, we demonstrate a 150 W calorimetric accuracy and 20W minimum detectable power. The capabilities of this instrument will allow for a more complete characterization of reactions occurring in nanoscale systems, such as the effects of hydrogenation in various metal films and nanostructures, as well as allow for direct stress compensation in QCM measurements.

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Hydrogen-induced changes of mechanical stress and optical transmission in thin Pd films

Cited by 38 publications

References 7 publications

Influence of hydrogen absorption on stress changes in thin catalytic metal films dedicated for sensors application

Influence of hydrogen absorption on stress changes in thin catalytic metal films dedicated for sensors application

Surface Electronic Properties of Discontinuous Pd Films during Hydrogen Exposure

Apparatus for combined nanoscale gravimetric, stress, and thermal measurements

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