2010
DOI: 10.1016/j.microrel.2010.01.026
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Hysteresis effect on traps of Si3N4 sensing membranes for pH difference sensitivity

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Cited by 16 publications
(7 citation statements)
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“…The higher operation voltage could also lead to an incremental variation of threshold voltage, the drift value, of the sensing membrane. 31,32) In our study, the improvement in the drift is similar to that of previous studies. 8,11) The advantage of using APTES/SiO 2 sensing membrane is not so obvious.…”
Section: Resultssupporting
confidence: 91%
See 1 more Smart Citation
“…The higher operation voltage could also lead to an incremental variation of threshold voltage, the drift value, of the sensing membrane. 31,32) In our study, the improvement in the drift is similar to that of previous studies. 8,11) The advantage of using APTES/SiO 2 sensing membrane is not so obvious.…”
Section: Resultssupporting
confidence: 91%
“…The reason is that the hysteresis was also affected by the capacitive coupling effect, and the higher operation voltage. 31,32) To compare the capacitive coupling effect, we extracted the percentage error of DG hysteresis from sensitivity. Here the percentage error is defined as the quotient of hysteresis and sensitivity values.…”
Section: Resultsmentioning
confidence: 99%
“…In order to understand the role of APTES modification on pH sensitivity, C-V hysteresis measurements were conducted in the devices with planar, silanized and textured (with particles of 135 nm diameter) dielectrics at pH 4 by sweeping the voltage up from −3 V to 2 V and then down from 2 V to −3 V. Figure 3 clearly shows an increase in hysteresis upon silanization up to 76 mV from the base value of 28 mV (for planar EIS) and a decrease subsequently upon texturing to an intermediate level of 56 mV. Lue et al 24 attributed the hysteresis effect and the reduced pH sensitivity to the large number of interface traps present at the oxide-semiconductor interface due to the lattice mismatch in the Si/Si 3 N 4 based EIS. However, in the present case, both the C-V hysteresis and the pH sensitivity increased upon texturing, suggesting the hysteresis phenomenon in the EIS devices was induced by the silanization instead of any increase in the interface states at the oxide-semiconductor interface.…”
Section: Effect Of Silanization/texturing On Capacitance-voltage (C-v...mentioning
confidence: 99%
“…Interface states (N ss ).-Interface states (traps) present at the dielectricsemiconductor interface cause hysteresis in the C-V characteristics of the EIS devices and, in turn, influence the pH sensitivity. 24 In order to study the effect of texturization, the density of the interface states (N ss ) at the oxide-semiconductor junction was obtained from C-V and G-V plots using the Hill-Coleman method. 17 Table II lists the values of N ss of various MOS devices.…”
Section: Effect Of Silanization/texturing On Capacitance-voltage (C-v...mentioning
confidence: 99%
“…Particularly, the sensing membranes comprised thin SiO 2 and Al 2 O 3 layers are designed for good interface property and strong immunity against the chemical solutions, respectively. 15,16) In general, for deposition of this Al 2 O 3 materials, vacuumprocessed deposition methods such as sputtering, atomic layer deposition (ALD) or chemical vapor deposition (CVD) are used. [17][18][19] However, these process techniques require very expensive equipments and high fabrication cost despite the good performance of oxide layers.…”
Section: Introductionmentioning
confidence: 99%