2018
DOI: 10.1063/1.5038809
|View full text |Cite
|
Sign up to set email alerts
|

In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Abstract: An in-situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X has been developed to provide routine calibration between plasma shots. XICS is able to determine plasma flow profiles by measuring the Doppler shift of x-ray line emission from high charged impurity species. A novel design is described that uses an x-ray tube with a cadmium anode placed in front of the diffracting spherically bent crystal. This arrangement provides calibration lines over the full detector extent… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
5
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
10

Relationship

3
7

Authors

Journals

citations
Cited by 14 publications
(5 citation statements)
references
References 7 publications
0
5
0
Order By: Relevance
“…The line-average plasma density is measured by a singlechannel interferometer [41], and the plasma density profile is measured by TS. The ion temperature profile in W7-X is measured by an x-ray imaging crystal spectrometer (XICS) diagnostic [42][43][44] and a charge exchange recombination spectroscopy (CXRS) diagnostic [45]. To enable CXRS T i measurements, short 10 ms beam blips (compared to τ E > 100 ms of neutral beam injection (NBI) heating) are used.…”
Section: Profile Preparationmentioning
confidence: 99%
“…The line-average plasma density is measured by a singlechannel interferometer [41], and the plasma density profile is measured by TS. The ion temperature profile in W7-X is measured by an x-ray imaging crystal spectrometer (XICS) diagnostic [42][43][44] and a charge exchange recombination spectroscopy (CXRS) diagnostic [45]. To enable CXRS T i measurements, short 10 ms beam blips (compared to τ E > 100 ms of neutral beam injection (NBI) heating) are used.…”
Section: Profile Preparationmentioning
confidence: 99%
“…Here, the plasma pressure profile is utilized by the form p ∝ (1 − s) α , where s is the normalized toroidal flux. Such form has an acceptable fit to experimental measurements derived from TS system and X-ray Imaging Crystal Spectrometer [54]. A good agreement can be accessed in the selected discharge if assuming α = 3 as shown in figure 3.…”
Section: Modeling Set-upmentioning
confidence: 67%
“…In figure 7 the inferred ion temperature profiles (blue lines + stars) are shown for two discharges (#20181009.034, #20180920.011) which were already described and used to fit density profiles in the previous section. The fitted profiles are compared to data from the CXRS system [21] (black dots) measuring carbon emission and a fit of x-ray imaging crystal spectrometer (XICS) data [16,23] (orange line). The XICS data is corrected by subtracting 200 eV at every radial point.…”
Section: Main Ion Temperature Profile Inferencementioning
confidence: 99%