2017
DOI: 10.1088/1367-2630/aa936b
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Impact ionization dynamics in silicon by MV/cm THz fields

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Cited by 41 publications
(22 citation statements)
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“…wafers in the beam path [47]. In the collimated beam path the field strength is much lower than in the focus region, and we have confirmed that any nonlinear processes in the HR-Si wafers such as impact ionization [48] are undetectable. The absolute field strength is calibrated by measuring the phase retardation in the electro-optic sampling and relating this to the field strength via the known electro-optic coefficient of ZnTe.…”
Section: Experimental Setups For Nonlinear Single-pulse and Two-dimensupporting
confidence: 67%
“…wafers in the beam path [47]. In the collimated beam path the field strength is much lower than in the focus region, and we have confirmed that any nonlinear processes in the HR-Si wafers such as impact ionization [48] are undetectable. The absolute field strength is calibrated by measuring the phase retardation in the electro-optic sampling and relating this to the field strength via the known electro-optic coefficient of ZnTe.…”
Section: Experimental Setups For Nonlinear Single-pulse and Two-dimensupporting
confidence: 67%
“…A pair of freestanding wire grid polarizers can perform this task as long as the THz signal has its spectral components within the high extinction range of the wire grids, when wavelength is much larger than the wire spacing. As a few examples, wire grid-based attenuation has been used in a range of nonlinear THz studies, using pulses generated by femtosecond tilted pulse front excitation of lithium niobate covering the spectral range up to approximately 2 THz [5,[14][15][16] and femtosecond pumping of organic nonlinear crystals with frequencies up to 5 THz [17]. The main advantage of using a pair of crossed freestanding wire grid polarizers for attenuation is the absence of a substrate, and thus there are no unwanted internal substrate reflections that disturb the signal.…”
Section: Introductionmentioning
confidence: 99%
“…Under this condition, the charge carriers acquire high energies solely because of collisions in the presence of a high-frequency electric field [1,14,15]. Being primarily observed in bulk InSb crystals this effect was further demonstrated for very different three-and two-dimensional semiconductor systems [16][17][18][19][20][21][22][23]. A distinction of the light impact ionization reported in the present work is that it occurs in a system with the Fermi level larger than the forbidden gap.…”
Section: Introductionmentioning
confidence: 99%