Impact of Aging Phenomena on Latches’ Robustness

Abstract

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Modeling Soft-Error Reliability Under Variability

“…8. Color C-2 represents a FI campaign of 74000 injected faults at 188 flip-flops (FFs) of the non-aged circuit, which produce a total of 1181 functional failures as in (4). The 188 FFs are explained as high failure vulnerability FF-instances out of 720 FFs.…”

“…Scientific efforts significantly highlighted the relevance of experiments that account for the impact of aging on softerror reliability. The works [3], [4] and [5] have proposed their methods and chronicled their observations on soft-error susceptibility under circuit aging. A. Gebregiorgis in [6] has presented a cross-layer reliability analysis in the presence of soft-errors, aging, and process variation effects.…”

Majority and Minority Voted Redundancy Scheme for Safety-Critical Applications with Error/No-Error Signaling Logic

“…Nanoelectronic circuits and systems are found to be more prone to multiple faults or failures [1] due to harsh environmental phenomena such as radiation [2][3][4][5][6] and/or aging [7,8]. Hence, when such circuits or systems are deployed in safety-critical applications such as aerospace, defense, nuclear plants, etc., redundancy is incorporated by default to cope with the arbitrary fault(s) or failure(s) of constituent function blocks, which are subject to a pre-defined fault tolerance bound.…”