2015
DOI: 10.1016/j.cap.2015.03.026
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Impact of growth temperature on the properties of SnS film prepared by thermal evaporation and its photovoltaic performance

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Cited by 105 publications
(57 citation statements)
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“…As the substrate temperature is increased from 250 to 350 • C, the grain dimension grows from 10 2 to 10 3 nm. At 350 • C the SnS grains showed a very compact morphology: No more flake-like crystal structures were observed, in accordance to what is reported in [8,53].…”
Section: Substrate Temperaturesupporting
confidence: 90%
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“…As the substrate temperature is increased from 250 to 350 • C, the grain dimension grows from 10 2 to 10 3 nm. At 350 • C the SnS grains showed a very compact morphology: No more flake-like crystal structures were observed, in accordance to what is reported in [8,53].…”
Section: Substrate Temperaturesupporting
confidence: 90%
“…As the substrate temperature is increased from 250 to 350 °C, the grain dimension grows from 10 2 to 10 3 nm. At 350 °C the SnS grains showed a very compact morphology: No more flake-like crystal structures were observed, in accordance to what is reported in [8,53]. Figure 2 shows the X-ray diffraction (XRD) patterns of the as-deposited SnS film, the crystalline structure was analyzed with a Thermo ARL X'TRA powder diffractometer (in Bragg-Brentano geometry, equipped with a Cu-anode X-ray source (Kα, λ = 1.5418 Å) and a Peltier Si (Li)-cooled solid state detector, (Thermo Fisher, Waltham, MA, USA).…”
Section: Substrate Temperaturesupporting
confidence: 90%
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