Implementation methodology of industrial and automotive ESD, EFT and surge generator models which predict EMC robustness on ICs and systems

Leveugle, C.; Weyl, Thorsten

doi:10.23919/eosesd.2017.8073453

Cited by 4 publications

(3 citation statements)

References 4 publications

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“…The scope varies and the primary focus is only to replicate the disturbance as defined in the specification. However, detailed and precise models over a wide range of load conditions have been implemented and tested in [52]. The study also highlights some of the inaccuracies of the standards, showing that different pass/fail EMC results can result from the use of different test equipment.…”

Section: Review On Various Methodologies Used In Recent Work To Predict Emimentioning

confidence: 99%

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A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

Baba

Mustapha²,

Hasbullah³

2022

IJEECS

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The proper function of the integrated circuit (IC) in an inhibiting electromagnetic environment has always been a serious concern throughout the decades of revolution in the world of electronics, from disjunct devices to today’s integrated circuit technology, where billions of transistors are combined on a single chip. The automotive industry and smart vehicles in particular, are confronting design issues such as being prone to electromagnetic interference (EMI). Electronic control devices calculate incorrect outputs because of EMI and sensors give misleading values which can prove fatal in case of automotives. In this paper, the authors have non exhaustively tried to review research work concerned with the investigation of EMI in ICs and prediction of this EMI using various modelling methodologies and measurement setups.

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Section: Review On Various Methodologies Used In Recent Work To Predict Emimentioning

confidence: 99%

“…Novel disturbance generator models were developed to form part of a virtual EMC lab [52]. Current simulation models concentrate primarily on the IEC61000-4-2 discharged [53]- [54].…”

Section: Review On Various Methodologies Used In Recent Work To Predict Emimentioning

confidence: 99%

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

Baba

Mustapha²,

Hasbullah³

2022

IJEECS

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“…Manufacturers are regularly searching for practical and time-efficient techniques for reducing the potential limitations of IC obsolescence [8]. If an IC has become obsolete, it should be verified that its successor will not be more susceptible, in order to ensure that the whole system complies with at least the same performance level according to EMC standards.…”

Section: Introductionmentioning

confidence: 99%

Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers

Khan

Koohestani

Ramdani

et al. 2020

2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

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This paper investigates the obsolescence in EMC risk assessment by conducting an experimental case study on two commercially available Atmel microcontrollers (µCs), i.e. SAM3 and SAM7, the former being more recent but still pin-to-pin compatible. To this end, electrical fast transient (EFT) testing was performed according to the IEC 61000-4-4 standard to identify and clarify the failure occurring in the µCs individual voltage supply pins. The µC crash was considered as the immunity criterion to monitor the failure due to the EFT bursts. Results demonstrate, in a reproducible manner, that SAM3 was more immune to transient disturbances compared to SAM7 on all the considered supply pins, excluding the phase-locked loop. Moreover, regardless of the µC version, the core supply pin was found to be the most susceptible to EFT injection. These results show that replacing a SAM7 µC by a SAM3 µC calls for a detailed EMC analysis, particularly when dealing with obsolescence, since a more modern, compatible IC does not necessarily provide a higher immunity.

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Development of Injection Probes for Electrostatic Discharge Immunity Test of Integrated Circuits

Li,

Wang,

Jin

2024

2024 7th International Conference on Electronics Technology (ICET)

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Implementation methodology of industrial and automotive ESD, EFT and surge generator models which predict EMC robustness on ICs and systems

Cited by 4 publications

References 4 publications

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

A review on techniques and modelling methodologies used for checking electromagnetic interference in integrated circuits

Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers

Development of Injection Probes for Electrostatic Discharge Immunity Test of Integrated Circuits

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