2019
DOI: 10.1109/tcsii.2018.2846484
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Implications of Small Geometry Effects on <inline-formula> <tex-math notation="LaTeX">$g_m/I_D$ </tex-math> </inline-formula> Based Design Methodology for Analog Circuits

Abstract: Small geometry effects have become increasingly important in analog circuits as transistors continue to shrink. As a result, transconductance-to-drain current (gm/ID) transistor parameters are no longer width-independent. In this brief, a procedure to develop "unit-sized" transistors with minimal sensitivity to small geometry effects is proposed. It is shown that by using the "unit-sized" transistors, the impact of small geometry effects on gm/ID dependent parameters such as current density and self gain can b… Show more

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Cited by 15 publications
(4 citation statements)
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“…W F is ∼450 nm for an NMOS device in the target technology. This shift in V th is caused by the fringing capacitances between the gate, side-wall and active area [21]. Similar observations can be made for PMOS devices where in both cases, DIBL and BDE are unfavorable for exploiting V th for performance.…”
Section: Impact Of Short Channel Effects On Devicessupporting
confidence: 60%
See 1 more Smart Citation
“…W F is ∼450 nm for an NMOS device in the target technology. This shift in V th is caused by the fringing capacitances between the gate, side-wall and active area [21]. Similar observations can be made for PMOS devices where in both cases, DIBL and BDE are unfavorable for exploiting V th for performance.…”
Section: Impact Of Short Channel Effects On Devicessupporting
confidence: 60%
“…As depicted, V th is no longer stable due to SCEs and therefore its impact on near/sub-V th regions could be undesirable, ascribed to the exponential dependency of V th on the drain current. The relationship of these terms to the on-current of the device can be formulated as follows [11], [19]- [21]:…”
Section: Impact Of Short Channel Effects On Devicesmentioning
confidence: 99%
“…7 shows that C 1 (W ) changes significantly with a factor of 2.12 between small (0.135 μm) and large geometries (1.35 μm). This illustrates the impact of small geometries on the constants V th and n, studied in [17]. Dissipative phenomena are put in evidence for small width.…”
Section: B F (W X) Pls Results For a Single Dendritementioning
confidence: 73%
“…In addition, the NF dependence was not addressed. In [14], a unit-sized transistor was used with with specific dimensions such that the impact of LDEs is minor. However, this approach assumes that any device must be an integer multiple of the unit-sized device, which deprives the designer from the flexibility of setting N F and W F according to the design requirements.…”
Section: Introductionmentioning
confidence: 99%