2020
DOI: 10.1049/iet-pel.2020.0001
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Improved Cauer thermal network considering thermal coupling effects of multi‐chip modules

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Cited by 5 publications
(2 citation statements)
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“…When I test = 10 A, where T ave is about 70 °C, the estimation error is about 5.0 °C, even when the thermal crosscoupling is ignored. In the existing studies, [19][20][21][22][23][24][25][26][27][28] the effect of the thermal cross-coupling may not be significant. In the environments where die temperature becomes higher, the errors of these studies would have been larger.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…When I test = 10 A, where T ave is about 70 °C, the estimation error is about 5.0 °C, even when the thermal crosscoupling is ignored. In the existing studies, [19][20][21][22][23][24][25][26][27][28] the effect of the thermal cross-coupling may not be significant. In the environments where die temperature becomes higher, the errors of these studies would have been larger.…”
Section: Resultsmentioning
confidence: 99%
“…Other studies for siliconbased insulated gate bipolar transistors (Si IGBTs) have validated their proposed thermal models by measured die temperatures. [19][20][21][22][23][24][25][26][27][28] In these reports, the temperature validation range is significantly limited, up to only 70 °C. It is much lower than the practical operation temperatures of the PMs intended to handle high power.…”
Section: Introductionmentioning
confidence: 99%