2017
DOI: 10.1063/1.4977887
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Improved electrical properties of atomic layer deposited tin disulfide at low temperatures using ZrO2 layer

Abstract: We report the effect of zirconium oxide (ZrO2) layers on the electrical characteristics of multilayered tin disulfide (SnS2) formed by atomic layer deposition (ALD) at low temperatures. SnS2 is a two-dimensional (2D) layered material which exhibits a promising electrical characteristics as a channel material for field-effect transistors (FETs) because of its high mobility, good on/off ratio and low temperature processability. In order to apply these 2D materials to large-scale and flexible electronics, it is e… Show more

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Cited by 15 publications
(17 citation statements)
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“…The obtained value is between those reported for the indirect bandgap of bulk (2.2 eV) and monolayer (2.6 eV) SnS 2 , which is reasonable considering the film thickness of ≈10 ML. Furthermore, the position of the Fermi level, which lies closer to the CB than the VB, is in line with the expected n‐type nature of SnS 2 films, and the band structure probed by VB‐XPS was comparable to previously measured SnS 2 single crystal …”
Section: Resultssupporting
confidence: 87%
See 1 more Smart Citation
“…The obtained value is between those reported for the indirect bandgap of bulk (2.2 eV) and monolayer (2.6 eV) SnS 2 , which is reasonable considering the film thickness of ≈10 ML. Furthermore, the position of the Fermi level, which lies closer to the CB than the VB, is in line with the expected n‐type nature of SnS 2 films, and the band structure probed by VB‐XPS was comparable to previously measured SnS 2 single crystal …”
Section: Resultssupporting
confidence: 87%
“…So far, only a single research group has deposited SnS 2 by ALD using Sn(NMe 2 ) 4 and H 2 S as precursors at 150 °C with improved film quality achieved through postdeposition annealing in S or H 2 S atmosphere. Nevertheless, many crucial features of film deposition, including conformality, uniformity, and thickness control have not been demonstrated for 2D SnS 2 films.…”
Section: Introductionmentioning
confidence: 99%
“…2020 [196] MoCl 5 + S(SiMe 3 ) 2 375 (800, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */GaN 8 ML 3.5 (2-4) n 10 2 2019 [197] 300 (900, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */sapphire 5 ML ≈3 (2.3-3.2) n ≈10 3 2019 [198] 350 (900, S) (t)Au/Cr/Al 2 O 3 */MoS 2 */sapphire 4 ML 0.56 d) 6.4 (≈3-10) e) n n >10 6 10 3 2020 [202] 400 (900, S) 2020 [199] 375 (800, inert) (+ 400, CS 2 ) 2017 [118] Mo 2017 [281] 155 (400, Ar + 500, S + 900, S) 2017 [241] 150 ( 2019 [242] 150 ( 2020 [70] Sn(dmamp) 2 + H 2 S plasma 150…”
Section: Field-effect Transistorsmentioning
confidence: 99%
“…Lee et al [241] deposited a 12 nm (≈20 ML) SnS 2 film by the most commonly used Sn(NMe 2 ) 4 + H 2 S process followed by annealing at 300 °C in a S 2 /H 2 /Ar atmosphere to crystallize the films. The prepared FETs exhibited a modest I on /I off ratio of 390 and mobility of 0.0076 cm 2 V −1 s −1 on a SiO 2 substrate.…”
Section: Field-effect Transistorsmentioning
confidence: 99%
“…In order to further improve SnS 2 crystallinity, several studies have invested more effort into the ALD SnS 2 process using TDMA-Sn and H 2 S as precursors. Ham et al 163 and Lee et al 170 deposited weak hexagonal SnS 2 films at 150 C but improved the crystallinity via post-annealing processes in sulfur vapor in the range of 250 C-350 C (Figures 10D and 10E). Ham et al 163 found that a 12-nm thick asdeposited SnS 2 film remained almost the same thickness after a 20-min annealing at 300 C (Figure 10D), but changed to $9.6 nm after a 20-min annealing at 350 C (Figure 10E).…”
Section: Snsmentioning
confidence: 99%