2012
DOI: 10.1016/j.microrel.2012.06.112
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Improved performance of GeON as charge storage layer in flash memory by optimal annealing

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Cited by 2 publications
(1 citation statement)
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“…Moreover, the retention characteristics of the device were still good even at 80% humidity, and the retention time was extrapolated to more than ten years. [38][39][40][41][42][43][44][45][46] These results are a clear indication that our device has high electrical stability. These results are a clear indication that the device has high electrical stability.…”
Section: Resultsmentioning
confidence: 83%
“…Moreover, the retention characteristics of the device were still good even at 80% humidity, and the retention time was extrapolated to more than ten years. [38][39][40][41][42][43][44][45][46] These results are a clear indication that our device has high electrical stability. These results are a clear indication that the device has high electrical stability.…”
Section: Resultsmentioning
confidence: 83%