1988
DOI: 10.1557/proc-116-413
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Improvement in Surface Morphology and Crystal Epitaxial CaF2 on Si (100) Through two Mbe Growth Stages

Abstract: We report the first study on improvement in surface morphology and crystal quality of as—grown epitaxial CaF2 film on a (100) Si substrate grown through two MBE growth stages without any post-growth treatment. The degree of improvement in surfacemorphology and crystal quality depends not only on the thickness of an initial thin CaF2 film grown at the early growth stage of 550ºC but also on both the subsrate temperature and thickness of a sequential grown CaF2 film used for thesecond growth stage. Under optimum… Show more

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Cited by 4 publications
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“…Generally, (001) CaF, growth on Si(001) substrates proceeds with ill facets. This growth preference can be overcome by employing a two step growth method P that results in smooth films [11]. The method used by us includes an initial nucleation stage at a substrate temperature of about 5500C where a 50-100 nm thick film is deposited followed by a ramp in substrate temperature up to about 7500C where a second, smooth layer is grown.…”
Section: Resultsmentioning
confidence: 99%
“…Generally, (001) CaF, growth on Si(001) substrates proceeds with ill facets. This growth preference can be overcome by employing a two step growth method P that results in smooth films [11]. The method used by us includes an initial nucleation stage at a substrate temperature of about 5500C where a 50-100 nm thick film is deposited followed by a ramp in substrate temperature up to about 7500C where a second, smooth layer is grown.…”
Section: Resultsmentioning
confidence: 99%