Improvement of Efficiency of Ultraviolet Radiation in a Plasma Display Panel with a Complex Buffer Gas

Abstract

We study the level spacing distribution p(s) in the spectrum of random networks. According to our numerical results, the shape of p(s) in the Erdős-Rényi (E-R) random graph is determined by the average degree k and p(s) undergoes a dramatic change when k is varied around the critical point of the percolation transition, k = 1. When k 1, the p(s) is described by the statistics of the Gaussian orthogonal ensemble (GOE), one of the major statistical ensembles in Random Matrix Theory, whereas at k = 1 it follows the Poisson level spacing distribution. Closely above the critical point, p(s) can be described in terms of an intermediate distribution between Poisson and the GOE, the Brodydistribution. Furthermore, below the critical point p(s) can be given with the help of the regularized Gamma-function. Motivated by these results, we analyse the behaviour of p(s) in real networks such as the internet, a word association network and a protein-protein interaction network as well. When the giant component of these networks is destroyed in a node deletion process simulating the networks subjected to intentional attack, their level spacing distribution undergoes a similar transition to that of the E-R graph.

Production efficiencies of Kr*(1s5,1s4) atoms leading to vacuum-ultraviolet emissions in ac plasma display panels with Kr–Ne binary mixtures measured by laser-absorption spectroscopy

“…In principle, Kr and Ne can be obtained according to our measured linewidths at two different gas conditions ͑20% and 40%͒, although the procedure only from two data points may include fairly large errors. In any case, the obtained results are Kr = 1.96ϫ 10 −20 cm −1 cm 3 and Ne = 0.88ϫ 10 −20 cm −1 cm 3 for the 811.3 nm line, and Kr = 10.82ϫ 10 −20 cm −1 cm 3 and Ne = 1.17ϫ 10 −20 cm −1 cm 3 for the 829.8 nm line, respectively. It is noticed that the value of Kr for the 829.8 nm line is much larger than that for the 811.3 nm line.…”

“…At present, binary gas mixtures of Ne and Xe are commonly used in color displays, where the vacuum-ultraviolet ͑VUV͒ emission radiated from Xe * ͑1s 4 ͒ atoms in the resonance state at 147 nm and the molecular band emission from higher vibrational levels of Xe 2 * ͑0 u + ͒ excimers at 152 nm and from lower vibrational levels of Xe 2 * ͑0 u + ,0 u − ,1 u ͒ excimers at 173 nm are used to excite the visible phosphors. 1 The effort of efficiency improvement is pointing to the direction of increasing the Xe content in the Ne-Xe binary mixtures [2][3][4][5][6][7] or employing ternary mixtures with the third additives such as He, 8,9 Ar, 10,11 and Kr 12 as well as increasing the total filling pressure. 6,13 As for the structural issue, several trials are going on by using a longer electrode gap length, 14 making a groove in the dielectric layer in between the sustain electrodes, 15,16 or employing a third electrode for controlling the discharge characteristics.…”

Evaluation of improved efficiency with a diamond coating for a plasma display panel electrode

“…On the NEA surface, the Auger neutralizations of both Ne and Xe induce the high secondary electron emission. Using the one-dimensional fluid electric discharge simulation, 19 we compared the energy used for the discharge, the radiation intensity, the UV radiation efficiency, and the maximum discharge current of diamond to those of MgO. The reductions of the writing voltage and the sustaining voltage were demonstrated when ␥ Ne ϭ0.32 and ␥ Xe ϭ0.25.…”

“…The simulation features the fluid code and the local field approximation ͑LFA͒. 19 Also, the rates constants of various collision processes for each species are given. 19 The schematic of a PDP cell and the applied pulse voltage as a function of time are shown in Figs.…”

The effect of electrode tilt angle on the characteristics of coplanar dielectric barrier discharges with Xe-Ne mixtures

“…A number of simulation results revealing the underlying physics of a PDP discharge have been published in previous studies. [15][16][17][18][19][20][21][22][23][24][25][26][27][28] In this paper, we describe the simulation model in Sec. II, and a) Author to whom correspondence should be addressed.…”