2006
DOI: 10.1016/j.mejo.2005.02.126
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Improvement of the field emission characteristics of an oxidized porous polysilicon using annealed Pt/Ti surface emitter electrode

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Cited by 6 publications
(3 citation statements)
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“…Diffusion of emitter metal due to the Joule's heat induced by the high density of driving current degrades the insulating performance and finally induces the breakdown of insulator. To prevent the breakdown and degeneration, therefore, the detail process of the OPPS field emitter [3][4][5][6][7][8][9] needs to be investigated to improve its emission life time and reliability for the application to the display device.…”
Section: Field Emission Characteristics Of An Oxidized Porous Polysilmentioning
confidence: 99%
“…Diffusion of emitter metal due to the Joule's heat induced by the high density of driving current degrades the insulating performance and finally induces the breakdown of insulator. To prevent the breakdown and degeneration, therefore, the detail process of the OPPS field emitter [3][4][5][6][7][8][9] needs to be investigated to improve its emission life time and reliability for the application to the display device.…”
Section: Field Emission Characteristics Of An Oxidized Porous Polysilmentioning
confidence: 99%
“…Its emission efficiency is below 2% due to a large driving current, and the sample is not reliable because of a thin metal electrode of below 10 nm. Therefore, the OPPS field emitter [5,6] needs to improve if it wants to be viable as a display device.…”
Section: Introductionmentioning
confidence: 99%
“…A polysilicon layer with a thickness of 1.75 ㎛ was deposited on n+ doped p-type (100) silicon substrate using low-pressure chemical-vapor deposition(LPCVD) methods. We anodized in HF(49%) : ethanol = 1 : 1 solution at current density of 10mA/cm 2 for 15 seconds [2]. After anodization, OPPS field emitters were oxidized by an ECO technique.…”
mentioning
confidence: 99%