Improvements to numerical testability evaluation

Catelani, Marcantonio; Iuculano, G.; Liberatore, A.; Manetti, S.; Marini, Mauro

doi:10.1109/tim.1987.6312579

Cited by 23 publications

(15 citation statements)

References 2 publications

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“…Then a linear combination matrix C 1 can be numerically obtained from the QR factorization of the testability matrix B R R C (5) As was discussed in [5] , the system testability measure defined as the rank of the testability matrix is independent on parameter values, which means that the rank of the testability matrix is equal to a given testability measure almost everywhere in the parameter space. We will extend this result to ranks of all sub-matrices of the testability matrix that are used to determine the existence of ambiguity groups.…”

Section: Canonical Form Of Testability Matrixmentioning

confidence: 99%

Method for lower computation of testability analysis for analog circuit

Lei

Xie

Chen

2009

2009 9th International Conference on Electronic Measurement &Amp; Instruments

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A efficient approach to simplify the process of linearly combination matrix of testability matrix is presented to efficiently partition ambiguity group and canonical ambiguity group in low-testability analog circuits. The approach presented uses only a single QR factorization technique and fewer matrix computations applied to the testability matrix. Then testable components and all ambiguity groups and canonical ambiguity group can be obtained from equivalent binary matrix that has the same size as linear combination matrix. At last an experiment of Band-pass Filter Circuit is presented to demonstrate the effectives of the proposed algorithm.

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Section: Canonical Form Of Testability Matrixmentioning

confidence: 99%

Method for lower computation of testability analysis for analog circuit

Lei

Xie

Chen

2009

2009 9th International Conference on Electronic Measurement &Amp; Instruments

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“…I N RECENT years, there has been a growing interest on automatic procedures for analog-circuit fault diagnosis [1]- [8]. To perform this task, it is crucial to have a measure of the circuit solvability, i.e., of the solvability of nonlinear fault diagnosis equations.…”

Section: Introductionmentioning

confidence: 99%

“…For the sake of simplicity, a single-input-single-output circuit is considered. The input-output relationship (IOR) can be expressed in terms of transfer function as (1) where is the set of circuit parameters. Manuscript Testability can be calculated as the column rank of the Jacobian matrix , whose elements are the partial derivatives of the transfer function with respect to the circuit parameters [9] (2)…”

Section: Introductionmentioning

confidence: 99%

Algebraic Approach to Ambiguity-Group Determination in Nonlinear Analog Circuits

Cannas

Fanni

Montisci

2010

IEEE Trans. Circuits Syst. I

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In this paper, a symbolic procedure for ambiguity-group determination, based on the a priori identifiability concept, is proposed. The method starts from the analysis of the occurrence of circuit parameters in the coefficients of the input/output relationship in order to select the potential canonical ambiguity groups. This first step allows one to strongly reduce the problem complexity. In a second step, the obtained nonlinear system that imposes the ambiguity conditions is solved, resorting to Gröbner bases theory. Both of these steps are completely symbolic, thus avoiding round-off errors. Furthermore, the method can be applied to both linear and nonlinear circuits. An alternative approach is also proposed, which extends to nonlinear circuits a method presented in the literature, which can be directly applied only to linear circuits. The methods are illustrated by means of benchmarks regarding well-known linear and nonlinear circuits.

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“…Indeed, such degrees cannot be larger than twice the number of components dependent on the frequency which appear in the network under consideration [14].…”

Section: Numerical Algorithmmentioning

confidence: 99%

“…Algorithms for evaluating this kind of testability measure have been developed by the authors in the past years, using a numerical approach [13]- [14]. These algorithms were utilized for the implementation of programs for analog network testability calculation.…”

Section: Introductionmentioning

confidence: 99%

A new efficient method for analog circuit testability measurement

Liberatore

Manetti

Piccirilli

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I &Amp; M. 1994 IEEE Instrumentation and Measuremen

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Testing an electronic circuit is a vital part of its overall design and fabrication process. This problem is even going to be more critical with technology improvements and with the coexistence on a chip of analog and digital components. In fact the testing of mixed signal microsystems i very difficult compared to digital only devices. They do not lend themselves to earlier and simpler test routines. The entire mixed signal segment is hampered by the lack of design for testability methodologies and tools. In this field the concept of analog circuit testability is of fundamental importance. The aim of this work is to present a new symbolic approach for testability measurement of analog networks. The new method presents noteworthy advantages from a computational point of view with respect to previous techniques. In fact it does not require the computation of the sensitivities of the network functions but it is based only on the study of the network function symbolic coefficients. The new approach allows also the formulation of simple necessary conditions for maximum testability based only on the order of the network functions.

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Improvements to numerical testability evaluation

Cited by 23 publications

References 2 publications

Method for lower computation of testability analysis for analog circuit

Method for lower computation of testability analysis for analog circuit

Algebraic Approach to Ambiguity-Group Determination in Nonlinear Analog Circuits

A new efficient method for analog circuit testability measurement

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