2018
DOI: 10.1109/tvlsi.2018.2837220
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Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications

Abstract: Currently, faults suffered by SRAM memory systems have increased due to the aggressive CMOS integration density. Thus, the probability of occurrence of Single Cell Upsets (SCUs) or Multiple Cell Upsets (MCUs) augments. One of the main causes of MCUs in space applications are cosmic radiation. A common solution is the use of Error Correction Codes (ECCs). Nevertheless, when using ECCs in space applications, they must achieve a good balance between error coverage and redundancy, and their encoding/decoding circu… Show more

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Cited by 51 publications
(28 citation statements)
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References 29 publications
(73 reference statements)
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“…Because of embedded combined CAC-ECC in the NI, the router of NoC presented huge power consumption; hence, there is a need of reducing the power consumption in NoC. By analyzing various error control schemes in NI, flexible unequal error control (FUEC) methodology is introduced and generalized to any kind of error control codes [10].…”
Section: Advanced Noc Routermentioning
confidence: 99%
“…Because of embedded combined CAC-ECC in the NI, the router of NoC presented huge power consumption; hence, there is a need of reducing the power consumption in NoC. By analyzing various error control schemes in NI, flexible unequal error control (FUEC) methodology is introduced and generalized to any kind of error control codes [10].…”
Section: Advanced Noc Routermentioning
confidence: 99%
“…For thid, we employed a searching methodology based on the errors to be corrected and/or detected [19]. Although this methodology was initially employed to design flexible unequal error control (FUEC) codes, it has been successfully used to design different families of codes (e.g., [18,20,21]). First, let us briefly describe this methodology.…”
Section: Low Redundancy and Reduced Overhead (Lrro) Double Error Correction Codesmentioning
confidence: 99%
“…All LRRO DEC codes presented in this paper, as well as the considered BCH DEC codes, have been implemented and simulated to check if they achieve the expected error coverage. We implemented a simulation-based error injection tool [21] with which we could analyze the error coverage of the different ECCs. This tool can inject diverse error models.…”
Section: Implementation and Logic Synthesismentioning
confidence: 99%
“…However, ECCs have power, delay, and area overhead. 7,8 Hence, researchers are focusing on designing radiation-hardened cells to mitigate soft-error. 7 Conventional 6T SRAM does not possesses radiation-hardened characteristics, because an SEU occurring at one storage node propagates to the other storage node due to the positive feedback of its cross-coupled inverters.…”
mentioning
confidence: 99%