2015
DOI: 10.1016/j.mssp.2014.01.032
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Impurity free vacancy diffusion induced quantum well intermixing based on hafnium dioxide films

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Cited by 5 publications
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“…This might be due to complete inhabitation of intrinsic defects, possible oxygen vacancies, in the 100-nm thick HfO 2 film by Ga outdiffusion. 34 In addition, the alteration of strain at the HfO 2 ∕GaAs interface (possibly from thermal matching to tensile strained GaAs surface region) at elevated annealing temperatures could also play a role in suppressing the interdiffusion process. 27 15 Alternatively, SAQDs deposited with the SrTiO 3 film are found to be a highly effective cap for intermixing suppression, as depicted in Fig.…”
Section: Plasma-enhanced Chemical Vapor Depositionmentioning
confidence: 99%
“…This might be due to complete inhabitation of intrinsic defects, possible oxygen vacancies, in the 100-nm thick HfO 2 film by Ga outdiffusion. 34 In addition, the alteration of strain at the HfO 2 ∕GaAs interface (possibly from thermal matching to tensile strained GaAs surface region) at elevated annealing temperatures could also play a role in suppressing the interdiffusion process. 27 15 Alternatively, SAQDs deposited with the SrTiO 3 film are found to be a highly effective cap for intermixing suppression, as depicted in Fig.…”
Section: Plasma-enhanced Chemical Vapor Depositionmentioning
confidence: 99%