2003
DOI: 10.1049/ip-opt:20030043
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In-plane photovoltaic and photoconductive effects on GaInAs and GaInNAs double quantum well structures

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Cited by 4 publications
(2 citation statements)
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“…We believe that this level is the well-known carbon impurity in the MBE-grown GaAs. Further evidence for this comes from the spectral dependence of in-plane photovoltage [13] and photoconductivity [17] measurements reported by us on the same sample.…”
Section: Resultsmentioning
confidence: 66%
“…We believe that this level is the well-known carbon impurity in the MBE-grown GaAs. Further evidence for this comes from the spectral dependence of in-plane photovoltage [13] and photoconductivity [17] measurements reported by us on the same sample.…”
Section: Resultsmentioning
confidence: 66%
“…A dc voltage was applied to the sample with a series resistor and the PC signal was detected using a lock-in amplifier [14]. IPV measurements were carried out by measuring the open circuit voltage using the differential input of a lock-in amplifier [15]. The IPV technique is different from SPV techniques because in the SPV the photovoltage is measured across the layers, while in the IPV two contacts are diffused through all the layers, and the longitudinal open circuit voltage is recorded between the contacts.…”
Section: Methodsmentioning
confidence: 99%