2006
DOI: 10.1016/j.apsusc.2005.07.030
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In situ monitoring and benchmarking in UHV of InP/GaAsSb heterointerface reconstructions prepared via MOVPE

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Cited by 5 publications
(3 citation statements)
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“…Interfaces between an Sb-containing layer and an Sb-free layer are known to suffer from the segregation of Sb [15,16]. The GaAsSb/InP hetero-interface, prepared with MOCVD was already investigated before [14,17]. Two different types of GaAsSb surface reconstructions had been observed: an As-rich cð4 Â 4Þ and an Sb-rich ð1 Â 3Þ-like.…”
Section: The Gaassb/inp Interfacementioning
confidence: 97%
See 1 more Smart Citation
“…Interfaces between an Sb-containing layer and an Sb-free layer are known to suffer from the segregation of Sb [15,16]. The GaAsSb/InP hetero-interface, prepared with MOCVD was already investigated before [14,17]. Two different types of GaAsSb surface reconstructions had been observed: an As-rich cð4 Â 4Þ and an Sb-rich ð1 Â 3Þ-like.…”
Section: The Gaassb/inp Interfacementioning
confidence: 97%
“…The investigations in Refs. [14,17] were made for an GaAsSb/InP interface grown at 500 C. In our case the InGaAsP top cell must be grown at 600 C on top of the InP layer. There are different options of the preparation routes differing in the growth temperature of the GaAsSb and InP layer.…”
Section: The Gaassb/inp Interfacementioning
confidence: 99%
“…Surface reconstructions with three-fold ordering along [11 0] have been reported for GaSb and GaAsSb. Several groups have observed ð1 Â 3Þ surface reconstructions in static MOVPE-grown GaAsSb surfaces [26][27][28]. A [11 0] cross-section diagram of a previously postulated ð1 Â 3Þ surface is shown in Fig.…”
Section: Rds Resultsmentioning
confidence: 99%