2019
DOI: 10.1016/j.jnucmat.2019.01.034
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In situ SEM-EBSD analysis of plastic deformation mechanisms in neutron-irradiated austenitic steel

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Cited by 128 publications
(45 citation statements)
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“…The previous results reported by our co-author in Rui et al [21] confirmed that KAM serves as a qualitative description of true dislocations density distribution using the coupled Electron Backscatter Diffraction and Electron Channeling Contrast Imaging observations. KAM plotted as a map reveals areas with an increased density of the defects, and as an average value for the whole scan, may reflect material strain history [21][22][23][24][25]. The KAM map is very similar with its GND map, as shown in Calcagnotto et al [22].…”
Section: Introductionmentioning
confidence: 53%
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“…The previous results reported by our co-author in Rui et al [21] confirmed that KAM serves as a qualitative description of true dislocations density distribution using the coupled Electron Backscatter Diffraction and Electron Channeling Contrast Imaging observations. KAM plotted as a map reveals areas with an increased density of the defects, and as an average value for the whole scan, may reflect material strain history [21][22][23][24][25]. The KAM map is very similar with its GND map, as shown in Calcagnotto et al [22].…”
Section: Introductionmentioning
confidence: 53%
“…This EDAX OIM software was used to calculate KAM values and maps. KAM is calculated using only the nearest neighbors (one step or first order KAM), maximum misorientation of 5 • , and all points in the kernel [25]. The inverse pole figure and phase distribution map are also calculated using this EDAX OIM software.…”
Section: Ebsd Testsmentioning
confidence: 99%
“…The nominal element composition is given in Table 1. One may see also that the selected material has a smaller grain size (~10-15 µm, Table 1), compared to many commercial 304L heats (e.g., 304L heat investigated earlier [19]).…”
Section: Tested Materials and Specimen Geometrymentioning
confidence: 92%
“…This scanning electron microscope (SEM) is equipped with an advanced Oxford Symmetry EBSD system (detector resolution 1244 × 1024 pixels, EBSD indexing rate up to ~200 Hz in full-frame mode, and ~3.5 kHz in 8 × 8 binning mode). The SEM has a slightly larger chamber compared to the VERSA 3D SEM, used previously [18], allowing for easier installation and operation of the Kammrath & Weiss in situ tensile frame [18,19]. For this SEM, the EBSD detector may be fully inserted (insertion distance >175 mm) when the tensile stage is installed in the chamber.…”
Section: Sem/ebsd System and Miniature Tensile Frame For In Situ Testingmentioning
confidence: 99%
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